Rapid Prototype MCM Test Engineering System

点击翻译按钮获取中文摘要

This Small Grant for Exploratory Research (SGER) award is to prepare detailed plans and protocols for university-based remote- accessed MultiChip Module (MCM) testing services for universities. Current MCM testing is proprietary, product specific, and without university involvement. This research contributes to the development of standard public domain processes that can be used for prototype quantity testing of MCMs whose electrical, physical, and test designs are done at universities. Plans provide for testing of bare chips, bare substrate and assembled modules for various assembly methods and degrees of testing automation.