Resonant tender X-ray scattering of organic semiconductors

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This project aims to establish resonant tender X-ray scattering as a mature technique for unravelling the complex microstructure of organic semiconductor layers. By understanding and exploiting the resonant interaction between organic semiconductors and X-rays tuned to appropriate absorption edges, new information about the molecular packing of these materials will be obtained. The expected outcomes are new experimental methodologies and analysis tools for determining the complex structure of technologically relevant materials. Benefits include understanding of the properties of solution-processed semiconductors enabling the design of high performance materials with applications in energy, electronics, lighting and health.