Acquisition of Atomic Force Microscope and Surface Forces Apparatus for Studies of Polymer Interfaces

购买原子力显微镜和表面力装置来研究聚合物界面

• 批准号: 9214376
• 负责人: Mohamed El-Aasser
• 金额: $ 17万
• 依托单位: Lehigh University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1992
• 资助国家: 美国
• 起止时间: 1992-09-15 至 1997-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9214376&HistoricalAwards=false
• 关键词: Acquisition; Atomic; Force; Microscope; Surface

An Atomic Force Microscope with a Scanning Tunneling head and a Surface Force Apparatus will be utilized to study polymer interfaces at Lehigh University's new Polymer Interface Center. These instruments have the respective ability to image surfaces on the nanometer scale and to measure the forces of interaction between surfaces. They are essential complements to existing microscopic and spectroscopic instrumentation in the ongoing and planned research at Lehigh on well-defined model polymer/substrate systems. The polymer/substrate interface will be characterized, and the adsorption/desorption of polymers on the substrate and the relationship between polymer morphology and the physical and chemical properties of the substrate surface will be studied. In addition, these instruments will enable direct measurement of the force of interaction between colloidal particles and enhance research in other multidisciplinary materials-related areas such as bioseparation, catalysis, and microelectronic packaging. Placing them in the Polymer Interface Center will ensure that they will be utilized by a wide variety of research groups both at Lehigh and from industry. //

带扫描隧道头的原子力显微镜 表面力仪将被用来研究 聚合物界面在利哈伊大学的新聚合物 接口中心。 这些工具具有各自的 能够在纳米尺度上对表面进行成像， 测量表面之间的相互作用力。 他们 是对现有微观和 正在进行和计划中的光谱仪器 在利哈伊对明确定义的模型聚合物/基质的研究 系统. 聚合物/基底界面将是 表征，以及聚合物在 基材与聚合物的关系 形态和物理和化学性质的影响。 将研究衬底表面。 另外这些 仪器将能够直接测量的力量， 胶体颗粒与增强剂之间相互作用 其他多学科材料相关领域的研究 例如生物分离、催化和微电子 包装. 将它们放置在聚合物界面中心 将确保它们将被各种各样的 利哈伊和工业界的研究小组。 //