NSF Young Investigator

这是1992财年的NYI奖。这个为期五年的研究项目侧重于形状记忆单晶的微机械材料行为，以及对微观结构在形状记忆单晶整体行为中的作用的理解。一个主要目标是建立一个改进版的云纹显微镜，将允许测量表面变形场附近的裂纹尖端在加载过程中。从该装置的应用中产生的实验数据将用于制定模型，以预测这类潜在重要材料的裂纹扩展和随后的失效。

This is an NYI award for FY 92. This five year research program focuses on the micromechanical material behavior of shape-memory single crystals and on developing an understanding of the role of microstructure in the overall behavior of shape-memory single crystals. A primary goal is to build an improved version of a moire microscope that will allow for the measurement of the surface deformation field near a crack tip during loading. Experimental data arising from the application of this device will be used to formulate models for predicting crack growth in, and subsequent failure of, this potentially important class of materials.