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Acquisition of an Analytical Electron Microscope

购买分析电子显微镜

基本信息

批准号：
9401839
负责人：
George Hadjipanayis
金额：
$ 11.5万
依托单位：
University of Delaware
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
1994
资助国家：
美国
起止时间：
1994-07-01 至 1995-06-30
项目状态：
已结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=9401839&HistoricalAwards=false
关键词：
Acquisition Analytical Electron Microscope

项目摘要

9401839 Hadjipanayis This award for a modern analytical electron microscope will support and augment the materials research programs in the Department of Physics and Astronomy and in the Department of Chemistry at the University of Delaware. Programs include magnetic domain and Microstructural studies in permanent magnets and magnetic thin films, melting and freezing of small particles and multilayers, and the structure morphology of ultrafine particles. The microscope is a JEOL JEM 2000FX scanning transmission electron microscope equipped with several accessories including an X-ray detector, special lenses for magnetic imaging (both Lorentz microscopy and DPC imaging), and heating and cooling stages. It will replace a 28 year-old JOEL JEM 100 C TEM. The high resolution capability of the JEM 2000FX is needed to characterize the grain boundary phases observed in novel permanent magnet materials, the core-shell-type structure morphology of ultrafine particles, interfacial effects in nanocomposites, the role of defects in freezing and melting of small particles, and the structure morphology of small semiconductor particles. Several other Departments and Research Centers also have ongoing programs which urgently require the use of this instrument, which does not exist at the University of Delaware. Each of these research programs will benefit greatly from the presence of the modern electron microscope and interdisciplinary research will be enhanced. In addition, the microscope will offer the type of education and training in state-of-the-art electron microscopy skills needed by students and post-doctors. ***

[401839] Hadjipanayis现代分析电子显微镜奖将支持和扩大特拉华大学物理与天文系和化学系的材料研究项目。课程包括永磁体和磁性薄膜的磁畴和微观结构研究，小颗粒和多层的熔化和冻结，以及超细颗粒的结构形态。该显微镜是JEOL JEM 2000FX扫描透射电子显微镜，配备了几个配件，包括x射线探测器，用于磁成像的特殊透镜（包括洛伦兹显微镜和DPC成像），以及加热和冷却阶段。它将取代已有28年历史的JOEL JEM 100 C TEM。为了表征新型永磁材料的晶界相、超细颗粒的核壳型结构形态、纳米复合材料中的界面效应、小颗粒冻结和熔化过程中缺陷的作用以及半导体小颗粒的结构形态，需要JEM 2000FX的高分辨率。其他几个系和研究中心也有正在进行的项目，迫切需要使用这种仪器，而特拉华大学并不存在这种仪器。这些研究项目中的每一个都将受益于现代电子显微镜的存在，跨学科的研究将得到加强。此外，显微镜将提供学生和博士后所需的最先进的电子显微镜技能的教育和培训。＊＊＊