Acquisition of an Analytical Electron Microscope

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9401839 Hadjipanayis This award for a modern analytical electron microscope will support and augment the materials research programs in the Department of Physics and Astronomy and in the Department of Chemistry at the University of Delaware. Programs include magnetic domain and Microstructural studies in permanent magnets and magnetic thin films, melting and freezing of small particles and multilayers, and the structure morphology of ultrafine particles. The microscope is a JEOL JEM 2000FX scanning transmission electron microscope equipped with several accessories including an X-ray detector, special lenses for magnetic imaging (both Lorentz microscopy and DPC imaging), and heating and cooling stages. It will replace a 28 year-old JOEL JEM 100 C TEM. The high resolution capability of the JEM 2000FX is needed to characterize the grain boundary phases observed in novel permanent magnet materials, the core-shell-type structure morphology of ultrafine particles, interfacial effects in nanocomposites, the role of defects in freezing and melting of small particles, and the structure morphology of small semiconductor particles. Several other Departments and Research Centers also have ongoing programs which urgently require the use of this instrument, which does not exist at the University of Delaware. Each of these research programs will benefit greatly from the presence of the modern electron microscope and interdisciplinary research will be enhanced. In addition, the microscope will offer the type of education and training in state-of-the-art electron microscopy skills needed by students and post-doctors. ***