Oxidation Studies of Silicon Oxynitride Ceramics Using Time-Resolved Laser Reflectance

小行星9401856 氮氧化硅是一种重要的结构陶瓷。 首席研究员希望研究控制氮氧化硅氧化行为的机制。 将对纯致密的氮氧化硅进行全面的氧化研究。 为了实现该项目的目标，时间分辨激光反射技术将用于精确测量氧化过程中的氧化层的生长在宽范围内。 其他几种技术，如X射线光电子能谱，电子能量损失谱TEM将用于执行氧化物-衬底界面的化学和结构表征。 %%% 研究的机制，控制的氧化行为的一个重要的结构陶瓷，氮氧化硅，建议进行使用时间分辨激光反射法和各种X射线和电子显微镜技术。 ***

9401856 Du Silicon oxynitride is an important structural ceramics. The Principal Investigator wants to study the mechanism that controls the oxidation behavior of silicon oxynitride. Comprehensive studies of oxidation on pure and dense silicon oxynitride will be carried out. To achieve the project objectives a time resolved laser reflectance technique will be used to accurately measure the growth of the oxide layer during oxidation in broad range. Several other techniques e.g. x-ray photoelectron spectroscopy, electron energy loss spectroscopy TEM will be used to perform the chemical and structural characterization of the oxide-substrate interfaces. %%% Study of the mechanisms that controls the oxidation behavior of one of the important structural ceramics, silicon oxynitride, is proposed to be carried out using the time resolved laser reflectance method and various x-ray and electron microscopic techniques. ***