MRIA: Complete Testability with Partial Scan

本文研究的是部分扫描在系统测试中的应用。目标是找到不牺牲故障覆盖率的解决方案。解决的主要问题是：给定一个顺序电路，在保持完全或100%故障覆盖率的情况下，找到要包含在扫描链中的最小触发器集。方法是为特定的扫描链配置定义一个度量，即“利润”。这个度量等于使用确定性测试生成技术获得测试目标故障所需状态的概率。各种优化技术被用来寻找具有较大利润的扫描链配置。使用这种技术的算法正在被开发成一种测试工具。

This research is on the use of partial scan for system test. The goal is to find solutions that do not sacrifice fault coverage. The main problem addressed is: given a sequential circuit, find the minimal set of flip-flops that are to be included in the scan chain while maintaining complete or 100% fault coverage. The approach is to define a metric, "profit", for a particular scan chain configuration. This metric is equal to the probability that the required states for testing the target faults will be obtained using deterministic test generation techniques. Various optimization techniques are being used to find the scan chain configuration that has large profit. Algorithms for using this technique are being developed into a test tool.