NSF Young Investigator

NSF 青年研究员

• 批准号: 9458001
• 负责人: Paul McEuen
• 金额: $ 31.25万
• 依托单位: University of California-Berkeley
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1994
• 资助国家: 美国
• 起止时间: 1994-08-01 至 2000-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9458001&HistoricalAwards=false
• 关键词: NSF; Young; Investigator

Technical abstract: The focus of the research is to study the effects of quantum phenomena such as energy level quantization and single- electron charging on electronic transport in nanostructures. It is proposed to utilize an atomic force microscope (AFM) with a conducting tip to serve as a local electrostatic gate. A voltage applied to this tip will influence transport with a submicron resolution. Some of the systems to be studied with such a technique are chemically synthesized arrays of metal and semiconductor clusters with diameters less than 10 nanometers. These studies will be carried out at cryogenic temperatures. Other applications include local magnetic resonance measurements including magnetic resonance imaging on a submicron scale. Non-technical abstract: The focus of the research is to study effects of a single electron on the properties of extremely small, atomic sized, devices. It is proposed to utilize an atomic force microscope (AFM) with a conducting tip to serve as a local electrostatic gate. A voltage applied to this tip will influence transport with a microscopic resolution. Some of the systems to be studied with such a technique are chemically synthesized arrays of metal and semiconductor clusters with diameters of tens of atoms. Other applications include local magnetic resonance measurements on scale of perhaps a thousand atoms.

技术摘要：研究的重点是研究量子现象，如能级量子化和单电子电荷对纳米结构中电子输运的影响。提出利用带有导电尖端的原子力显微镜(AFM)作为局部静电门。施加到该尖端的电压将影响亚微米分辨率的传输。用这种技术研究的一些系统是直径小于10纳米的金属和半导体团簇的化学合成阵列。这些研究将在低温下进行。其他应用包括局部磁共振测量，包括亚微米尺度的磁共振成像。非技术摘要：研究的重点是研究单个电子对极小的、原子大小的器件性能的影响。提出利用带有导电尖端的原子力显微镜(AFM)作为局部静电门。施加到该尖端的电压将以微观分辨率影响传输。用这种技术研究的一些系统是用化学方法合成的直径为数十个原子的金属和半导体团簇的阵列。其他的应用还包括在一千个原子的尺度上进行局部磁共振测量。