A Laboratory for Integrating Digital Design and Test

随着数字电路的复杂性不断增加--例如，Intel Pentium-P6处理器(1995年)有550万个晶体管，而80386(1989年)处理器只有不到50万个--器件测试的成本也急剧增加。测试的日益复杂已经将越来越多的测试责任转移到了设计工程师身上。如今，许多测试问题必须在较早的设计阶段进行计划。本项目介绍了数字设计课程测试中的各种问题和相应的技术。为了落实这一想法，该部门正在开发一个创新的实验室，通过动手实验将设计和测试联系起来。测试与设计的结合是现代计算机工程专业本科生能力范围内的一个重要属性。因此，该项目通过使用具有计算机辅助设计(CAD)工具和测试设施的实验室来满足这一新出现的需求。学生可以通过一组PLD(可编程逻辑器件)来实现他们的ASIC(专用集成电路)设计，而不需要等待IC制造的时间。许多测试技术，如DFT(可测试性设计)和BIST(内建自测试)，必须由学生在设计阶段进行计划。将仿真数据转换为测试程序，并在ATE(Automatic Test Equipment)上进行实际测试，以供学生自己设计，不仅可以提供动手体验，还可以为他们提供一个完整的数字系统设计视角。实验室基础设施作为一个整体能够满足设计和测试的要求。该设施每年可为100多名本科生提供三门数字系统领域的课程。这个系的方法和经验可以帮助其他欧洲经委会/CS项目为他们的学生提供丰富的数字设计教育。

As the complexity of digital circuits increases continuously_the Intel Pentium-P6 processor (1995), for example, has 5.5 million transistors while the 80386 (1989) had less than one-half million_the cost of device testing has also increased sharply. The rising complexity of testing has shifted more and more of the testing responsibility toward the design engineer. Today, many of the testing issues must be planned within the earlier design phase. This project introduces the various issues and corresponding techniques employed in testing to digital design courses. To implement this idea, the department is developing an innovative laboratory for linking design and testing through hands-on experiments. The integration of testing with design is an important attribute within the range of abilities of a modern day undergraduate computer engineering student. Thus, the project addresses this emerging need through the use of a laboratory with a computer-assisted design (CAD) tools and testing facility. Students can implement their ASIC (Application Specific Integrated Circuit) designs through a set of PLDs (Programmable Logic Device) without the waiting period for IC fabrication. Many of the testing techniques such as DFT (Design for Testability) and BIST (Build-in-Self-Test) must be planned in the design phase by students. Converting the simulation data into test programs and performing the actual testing on ATE (Automatic Test Equipment) for students' own designs can not only offer hands-on experience, but also provide them an integral perspective of the design of digital systems. The laboratory infrastructure is capable of meeting the demands of design and test as an integral unit. This facility can provide three courses in the digital system area for more than 100 undergraduate students annually. This department's approach and experience can help other ECE/CS programs to offer an enriched education in digital design to their students.