Acquisition of High Resolution X-Ray Diffractometer for Materials Research

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ABSTRACT CTS-9871338 David T. Wu, Louis J. Guido, Gary L. Povirk Yale University Title: Acquisition of High Resolution X-Ray Diffractometer for Materials Research The departments of Mechanical and Electrical Engineering at Yale University will purchase a Philips X'PERT Materials Research Diffractometer system with a wide range of options. Cost-sharing of over 47% is provided by the university. The primary uses will be in materials science projects, including Synthesis of Semiconductor Thin Films, Material Length Scales in Metal Plasticity, and Dynamics of Grain Growth. The equipment will be used also to enhance the teaching of materials science.