Acquisition of High Resolution X-Ray Diffractometer for Materials Research

购置高分辨率 X 射线衍射仪用于材料研究

• 批准号: 9871338
• 负责人: David Wu
• 金额: $ 17万
• 依托单位: Yale University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1999
• 资助国家: 美国
• 起止时间: 1999-01-01 至 2000-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9871338&HistoricalAwards=false
• 关键词: Acquisition; Resolution; Ray; Diffractometer; Materials

ABSTRACT CTS-9871338 David T. Wu, Louis J. Guido, Gary L. Povirk Yale University Title: Acquisition of High Resolution X-Ray Diffractometer for Materials Research The departments of Mechanical and Electrical Engineering at Yale University will purchase a Philips X'PERT Materials Research Diffractometer system with a wide range of options. Cost-sharing of over 47% is provided by the university. The primary uses will be in materials science projects, including Synthesis of Semiconductor Thin Films, Material Length Scales in Metal Plasticity, and Dynamics of Grain Growth. The equipment will be used also to enhance the teaching of materials science.

摘要CTS-9871338 David T.Wu，Louis J.Guido，Gary L.Povirk耶鲁大学标题：获得用于材料研究的高分辨率X射线衍射仪耶鲁大学机械和电气工程系将购买一套飞利浦X‘PERT材料研究衍射仪系统，可供选择的范围很广。超过47%的费用分摊由该大学提供。主要用途将在材料科学项目中，包括半导体薄膜的合成、金属塑性中的材料长度标尺和颗粒生长动力学。该设备还将用于加强材料科学的教学。