Acquisition of a Scanning Electron Microscope with Electron Backscatter Diffraction Capability for Research and Education

点击翻译按钮获取中文摘要

9975805KingThis award will provide partial support for a new scanning electron microscope to be housed in the Materials Characterization Laboratory of Stony Brook's Department of Materials Science and Engineering. The instrument will provide new capabilities in the area of electron backscatter pattern analysis, facilitating a broad range of studies of triple junctions in thin films and bulk materials, in addition to studies of texture and other related effects in materials. The instrument is also to be used to develop and apply novel techniques for the observation of sub-surface cracks in insulating coatings on conductive substrates.A wide range of other materials research projects will be enhanced by this acquisition: 14 Stony Brook faculty members will constitute the primary user-base of the instrument. A wide range of educational programs will also be enhanced by the new instrument.%%%The microscope will provide significantly improved service to general users from the Stony Brook campus and the Long Island region, and enrich the educational experience of students.