Ultrahigh Resolution Magnetic Resonance Imaging -On-A-Chip

1991年，有人提出，通过使用类似于原子力显微镜的扫描探针技术进行机械检测，可以实现具有单个质子级别的灵敏度的核磁共振(核磁共振)光谱。达到这种程度的灵敏度将是一个真正的革命性进步；它将允许具有化学特异性的三维原子尺度成像。机械检测的核磁共振成像，通常被称为核磁共振测力显微镜(MRFM)，现在比传统的核磁共振成像敏感许多个数量级。机械探测技术显然已经提供了惊人的进步，显然，MRFM即将获得显著的额外收益。我们预计，原子分辨率的磁共振成像将在几年内实现。作为最终目标的PI和co-PI提出的单核分辨率MRI仪器将需要一种全新的方法，一种涉及到混合电磁/磁/光/机械设备的单芯片集成。实现这样的设备将是对全世界所有现有工人在这一新的MRFM领域所走的道路的重要偏离。这一新的研究方向正是在本意见书中提出的。这笔赠款如果获得，将使私人投资公司能够利用他目前在纳米机电系统(NEMS)方面的努力和设施，在MRFM的新型集成系统(纳米芯片)的工程和科学方面取得重要进展。全面实施后，核磁共振力显微镜将成为一种独特的扫描探针仪器，提供原子力显微镜(AFM)的高空间分辨率，同时在工程科学中提供磁共振成像的三维可视化能力，它将使基于埋藏界面的各种新材料和电子设备的微观亚表面属性的新的高分辨率研究成为可能。这是一种既非破坏性又具有化学特异性的技术。

In 1991 it was proposed that nuclear magnetic resonance (NMR) spectrometry with sensitivity at the level of a single proton might be achievable through mechanical detection using scanned probe techniques similar to AFM. Achieving this degree of sensitivity would constitute a truly revolutionary advance; it would permit three-dimensional atomic-scale imaging, with chemical specificity. Mechanically-detected MRI, often called Magnetic Resonance Force Microscopy (MRFM) is now many orders of magnitude more sensitive than conventional MRI. The mechanical detection technique has clearly provided staggering advances, and it is clear that significant additional gains are on the horizon for MRFM. We project that MRI with atomic resolution will be attained in just a few years.The PI and co-PI propose as an ultimate goal MRI instruments with single-nucleus resolution, will require a radically new approach, one that involves single-chip integration of hybrid electro/magneto/opto/mechanical devices. Realizing such devices would be an important departure from the path being taken by all current workers, worldwide, in this new field of MRFM. This new research direction is what has been proposed in this submission. This grant, if awarded, will allow the PI to leverage his current efforts in, and facilities for, Nano Electro Mechanical Systems (NEMS) toward making important headway on the engineering and science of novel integrated systems (nanochips) for MRFM. When fully implemented, the magnetic resonance force microscope will become a unique scanned probe instrument offering the high spatial resolution of atomic force microscopy (AFM), while simultaneously offering three dimensional visualization capabilities of MRI within the engineering sciences it will enable new, high resolution studies of the microscopic subsurface properties for a broad range of new materials and electronic devices based upon buried interfaces. It is a technique that is both non-destructive and chemically specific.