MRI - Acquisition of Test Equipment for Wireless Microsystems at RF/Microwave Frequencies

正在申请的仪器将支持目前资助的五个研究项目，并将建立测试能力，以支持即将在RIT工程学院进行的微系统博士项目。上述规定的范围不会有重大变化。额外的资金将通过RIT、工程学院和工业支持获得。以下是修订后的设备清单的范围和理由。EE部门的微波和天线实验室确实具有出色的射频测量能力。然而，该实验室缺乏一些用于高频表征和微尺度结构测试的关键仪器。用于将芯片中的电路和封装上的电路连接到网络分析仪的探头测量系统不可用。佐治亚理工学院目前正在进行测量，以解决这一非常关键的配件的不足。这种短期的解决方案既繁琐又缓慢，而且阻碍了研究生自行优化设计。迫切需要一种探头测量系统。以前申请的探头和附件的数量已经减少，以与可用的资金相匹配。此外，以前要求对射频电路进行理论建模的软件已被删除，将通过研究资助和电气工程部的支持获得。微波实验室提供了频率高达6 GHz的网络分析仪，用于测量射频组件的反射和传输特性，表征CMOS和SiGe异质结双极晶体管(HBT)，并优化天线阵列的输入特性。然而，对于更高频率的微波电路特性，需要具有扩展到40 GHz的能力的网络分析仪。由于预算减少，先前要求的一些备选方案已被删除。其中最重要的几项保留了时间域选项、TRL定标和频偏模式。根据需要，电子工程部将提供电缆、GPIB套件、维修和服务等附件。优化智能天线系统所需的HP89441A型矢量信号分析仪已从设备清单中删除。目前，该仪器已由惠普公司出借给电机系用于课堂和研究用途。该公司有意与惠普谈判，以捐赠方式收购该设备。芯片和封装制造将在RLT的半导体和微系统制造实验室(SMFL)进行，该实验室具有完整的IC和MEMS制造能力。然而，目前在该设施中没有用于设备表征的微波和射频仪器。关键是要加强SMFL的测试能力，以支持RF-MEMS活动的增加，并支持微系统方面的博士水平研究。由于预算减少，最初要求的一些项目被删除。尽管混合信号测试需要射频信号发生器和数字示波器，但学院邻近系(电气和计算机工程)提供的其他系统应该足以作为短期解决方案。这些系统最终可能会通过额外的大学资金获得。最初提议的半自动探测站已被摩托罗拉要求建造。同样的型号，KLA 1201探测站，最近被摩托罗拉作为捐赠承诺。所需的仪器控制、数据收集和参数提取软件包将通过研究补助金和工业支助获得。

The instrumentation being requested would support five currently funded research projects and would establish test capabilities to support the upcoming Microsystems Ph.D. program in the College of Engineering at RIT. The previously stated scope will not change significantly. Additional funding will be obtained through RIT, the College of Engineering and industrial support. Following is the scope and justification for the revised equipment list.The Microwave and Antenna Lab, within the EE Department, does have excellent RF measurement capabilities. However the lab is short of some key instrumentation for higher frequency characterization and the testing of micro-scale structures. The probe measurement system for interfacing the circuitry in the chip and on the package to the network analyzer is not available. The deficiency of this very crucial accessory is currently being addressed by making measurements at Georgia Tech. This short-term solution is tedious and slow, and prevents graduate students from optimizing designs on their own. There is a critical need for a probe measurement system. The number of probes and accessories previously requested has been reduced, to match with the available funding. Also, software that was previously requested for theoretical modeling of RF circuitry has been removed and will be obtained through research funding and in conjunction with support from the Electrical Engineering Department.Network analyzers at frequencies up to 6 GHz are available in the Microwave lab, for measuring the reflection and transmission characteristics of RF components, for characterizing CMOS and SiGe heterojunction bipolar transistors (HBT's) and for optimizing input characteristics of antenna arrays. However, for higher frequency microwave circuit characterization a network analyzer with capabilities extending to 40 GHz is required. Because of the reduced budget, some of the options requested previously have been removed. The most important ones, such as the time domain option, the TRL calibration and the frequency-offset mode have been retained. Accessories such as cables, the GPIB kit, repair and service will be provided, as needed, by the EE Department.The HP89441A vector signal analyzer required for optimizing the smart antenna system has been removed from the equipment list. At present, this instrument has been loaned by HP to the Electrical Engineering Department for classroom and research purposes. It is the intention to negotiate with HP, for acquiring this equipment as a donation.The chip and package fabrication would be done in the Semiconductor and Microsystems Fabrication Laboratory (SMFL) of RLT, which has a complete IC and MEMS fabrication capability. However, there is currently no Microwave and RF instrumentation in the facility for device characterization. It is critical that the test capability of the SMFL be strengthened in order to support the increased activity in RF-MEMS, and to support Ph.D. level research in Microsystems. Because of the reduced budget, some of the items that were originally requested were removed. Although an RF signal generator and a digital oscilloscope are needed for mixed-signal testing, other systems that are available from neighboring departments in the college (Electrical and Computer Engineering) should be adequate as a short-term solution. These systems may eventually be acquired through additional college funding. The semi-automated probe station, originally proposed, has been requested from Motorola. An equivalent model, the KLA 1201 probe station, has been recently committed by Motorola as a donation. The requested software packages for instrument control, data collection and parameter extraction will be obtained through research grants and industrial support.