MRI - Acquisition of Test Equipment for Wireless Microsystems at RF/Microwave Frequencies

所要求的仪器将支持五个目前资助的研究项目，并将建立测试能力，以支持即将在RIT工程学院进行的微系统博士课程。前面声明的范围不会有重大变化。额外的资金将通过RIT、工程学院和工业支持获得。以下是修订后的设备清单的范围和理由。微波和天线实验室，在EE部门，确实有优秀的射频测量能力。然而，实验室缺乏一些用于高频表征和微尺度结构测试的关键仪器。目前还没有将芯片和封装上的电路连接到网络分析仪的探针测量系统。这个非常重要的配件的缺陷目前正在乔治亚理工学院通过测量来解决。这种短期解决方案冗长而缓慢，并且阻碍研究生自己优化设计。目前迫切需要一种探头测量系统。以前要求的探针和附件的数量已经减少，以配合现有的资金。此外，以前要求用于射频电路理论建模的软件已被删除，并将通过研究资金和电气工程部门的支持获得。频率高达6 GHz的网络分析仪可在微波实验室中使用，用于测量射频组件的反射和传输特性，用于表征CMOS和SiGe异质结双极晶体管（HBT）以及优化天线阵列的输入特性。然而，对于更高频率的微波电路表征，需要具有扩展到40 GHz功能的网络分析仪。由于预算减少，以前要求的一些备选办法已被取消。最重要的，如时域选项，TRL校准和频偏模式被保留。附件，如电缆，GPIB套件，维修和服务将提供，根据需要，由EE部门。优化智能天线系统所需的HP89441A矢量信号分析仪已从设备清单中删除。目前，这台仪器已被惠普借给电气工程系用于课堂和研究。这是意向与惠普协商，获得这台设备作为捐赠。芯片和封装制造将在RLT的半导体和微系统制造实验室（SMFL）完成，该实验室具有完整的IC和MEMS制造能力。然而，目前在该设施中没有微波和射频仪器用于器件表征。为了支持RF-MEMS中增加的活动，并支持微系统的博士级研究，SMFL的测试能力得到加强是至关重要的。由于预算减少，原先要求的一些项目被取消了。虽然混合信号测试需要射频信号发生器和数字示波器，但从学院邻近部门（电气和计算机工程）获得的其他系统应该足以作为短期解决方案。这些系统最终可能会通过额外的大学资助获得。最初提出的半自动探测站是摩托罗拉提出的要求。摩托罗拉公司最近捐赠了一个类似的型号KLA 1201探测站。所要求的用于仪器控制、数据收集和参数提取的软件包将通过研究经费和工业支持获得。

The instrumentation being requested would support five currently funded research projects and would establish test capabilities to support the upcoming Microsystems Ph.D. program in the College of Engineering at RIT. The previously stated scope will not change significantly. Additional funding will be obtained through RIT, the College of Engineering and industrial support. Following is the scope and justification for the revised equipment list.The Microwave and Antenna Lab, within the EE Department, does have excellent RF measurement capabilities. However the lab is short of some key instrumentation for higher frequency characterization and the testing of micro-scale structures. The probe measurement system for interfacing the circuitry in the chip and on the package to the network analyzer is not available. The deficiency of this very crucial accessory is currently being addressed by making measurements at Georgia Tech. This short-term solution is tedious and slow, and prevents graduate students from optimizing designs on their own. There is a critical need for a probe measurement system. The number of probes and accessories previously requested has been reduced, to match with the available funding. Also, software that was previously requested for theoretical modeling of RF circuitry has been removed and will be obtained through research funding and in conjunction with support from the Electrical Engineering Department.Network analyzers at frequencies up to 6 GHz are available in the Microwave lab, for measuring the reflection and transmission characteristics of RF components, for characterizing CMOS and SiGe heterojunction bipolar transistors (HBT's) and for optimizing input characteristics of antenna arrays. However, for higher frequency microwave circuit characterization a network analyzer with capabilities extending to 40 GHz is required. Because of the reduced budget, some of the options requested previously have been removed. The most important ones, such as the time domain option, the TRL calibration and the frequency-offset mode have been retained. Accessories such as cables, the GPIB kit, repair and service will be provided, as needed, by the EE Department.The HP89441A vector signal analyzer required for optimizing the smart antenna system has been removed from the equipment list. At present, this instrument has been loaned by HP to the Electrical Engineering Department for classroom and research purposes. It is the intention to negotiate with HP, for acquiring this equipment as a donation.The chip and package fabrication would be done in the Semiconductor and Microsystems Fabrication Laboratory (SMFL) of RLT, which has a complete IC and MEMS fabrication capability. However, there is currently no Microwave and RF instrumentation in the facility for device characterization. It is critical that the test capability of the SMFL be strengthened in order to support the increased activity in RF-MEMS, and to support Ph.D. level research in Microsystems. Because of the reduced budget, some of the items that were originally requested were removed. Although an RF signal generator and a digital oscilloscope are needed for mixed-signal testing, other systems that are available from neighboring departments in the college (Electrical and Computer Engineering) should be adequate as a short-term solution. These systems may eventually be acquired through additional college funding. The semi-automated probe station, originally proposed, has been requested from Motorola. An equivalent model, the KLA 1201 probe station, has been recently committed by Motorola as a donation. The requested software packages for instrument control, data collection and parameter extraction will be obtained through research grants and industrial support.