Collaborative Research: CRI: IAD: Electronic Testing Education, Research and Training Infrastructure

合作研究：电子测试教育、研究和培训基础设施这个为期三年的项目将开发数字、内存、模拟和射频设备的测试能力，未来可能升级到MEMS、光学和纳米技术设备。在该项目下开发的基础设施包括一个测试实验室及其增值应用程序。新的VLSI测试实验室将拥有现代化的开放式自动测试设备（ATE）。该实验室将设在阿拉巴马州的奥本大学，并将通过网络接入由该州的其他三所机构使用，即阿拉巴马大学塔斯卡卢萨分校、阿拉巴马大学亨茨维尔分校和塔斯基吉大学，以推进教育、培训和研究应用。在未来，测试实验室的基础设施将允许阿拉巴马州以外的大学合作使用，使其成为国家资源。这些应用将包括新的大学课程，包括数字、模拟和射频芯片、fpga和片上系统设备测试的实践实验；面向行业的培训课程，包括测试实验室练习；并对提高成品率和可靠性的硅调试方法进行了研究。以行业为重点的研究和以实践为导向的短期课程有望使该基础设施在三年的基础设施建设期之后得到行业资金的充分支持。

0708962Collaborative Research: CRI: IAD: Electronic Testing Education, Research and Training InfrastructureVishwani AgrawalThis three-year project will develop capabilities for testing of digital, memory, analog, and radio frequency devices, with possible future upgrades to MEMS, optical and nanotechnology devices. The infrastructure developed under this project consists of a test laboratory and its value-added applications. The new VLSI test laboratory will have modern automatic test equipment (ATE) of open architecture. The laboratory will be located at Auburn University in Alabama and will be used through networked access by three other institutions of that state, namely, University of Alabama at Tuscaloosa, University of Alabama at Huntsville, and Tuskegee University, for advancing education, training and research applications. In the future, the test lab infrastructure will allow collaborative use by universities outside Alabama as well, making it a national resource. The applications will include new university courses with hands-on experiments on testing of digital, analog and radio frequency chips, FPGAs and system-on-a-chip devices; industry-oriented training classes including test lab exercises; and research on silicon debug methods aimed at improving the yield and reliability. Research with industry focus and practice-oriented short courses are expected to make this infrastructure fully supported through industry funds beyond the three-year infrastructure building period.