Support of BGSW6: The 6th Biennial Geochemical SIMS Workshop; November 2-4, 2011 at the Outrigger Reef Hotel, Honolulu, Hawaii

这一研讨会奖项的主要目标是聚集二次离子质谱仪(SIMS)方面的专家，他们将介绍和讨论解决科学问题的技术方法、仪器操作和改进、标准以及对国家地球化学界的服务。这次研讨会将汇集来自全国地质SIMS实验室、仪器制造商和其他感兴趣的各方的科学家和学生，讨论SIMS微束分析技术的最新发展和科学结果。BGSW对国家地球化学界非常重要，因为它代表了美国以地球化学为导向的SIMS实验室的研究人员唯一的定期会议。这些设施对于开发新的地球化学SIMS应用程序以及为来自全国各地需要SIMS能力进行自己研究的科学家提供访问和专业知识至关重要。

The main goal of this workshop award is to gather specialists in Secondary Ion Mass-spectrometry (SIMS) who will present and discuss technical approaches to scientific problems, instrument operation and improvements, standards, and service to the national geochemical community. This workshop will bring together scientists and students from the nation's geological SIMS laboratories, instrument manufacturers, and other interested parties to discuss the state of the art of SIMS microbeam analysis techniques and scientific results. The BGSW is of great importance to the national geochemistry community since it represents the only regular meeting of researchers from geochemically-oriented SIMS labs in the United States. These facilities are vital for developing new geochemical SIMS applications and for providing access and expertise to scientists from across the country who require SIMS capabilities to carry out their own research.