MRI: Acquisition of a THz Spectroscopic Ellipsometer

授予托莱多大学的这一奖项是为了收购太赫兹光谱椭圆偏振仪，以测量0.11至1.45 THz范围内材料的光学特性和结构。 在这个区域中的光学性质预计是敏感的振动模式和吸收，由于自由载流子和光谱椭圆偏振法也可以用来推断层的厚度，界面的形成，和梯度。 在太赫兹范围内，光学特性接近直流极限，因此它们可以用来推断材料的电学特性（载流子浓度，迁移率等）。 从非接触式光学测量中提取电特性的能力对于探测器件结构中的材料或传统电特性难以表征的材料特别有吸引力，包括光伏材料和器件;用于非冷却红外传感器的微测辐射热计材料;包括纳米颗粒膜、碳纳米管膜、超材料和工程薄膜的结构化材料;铁电体和其他氧化物材料;托莱多大学的太赫兹光谱椭圆偏振仪将协助研究生和本科生的研究，以及使其他大学，政府实验室和工业界的研究人员之间的合作，揭示材料的光学，电学和结构特性之间的联系。 据信，这是同类工具中唯一既收费又协作的工具，预计将提供新的机会，进一步发展计量和分析专门知识网络。 太赫兹光谱椭圆偏振法的研究具有揭示新的基本信息的强大潜力，并将增强材料和设备中的物理机制的知识基础，用于技术（电子电路中的组件层），安全（化学和红外传感器）和能源（光电子学）应用。 同时，它将使下一代科学家和工程师的研究培训，谁将进一步发展其能力，并将其应用于探索新的研究领域。

This award to the University of Toledo is for the acquisition of a Terahertz Spectroscopic Ellipsometer to measure optical properties and structure of materials over a range from 0.11 to 1.45 THz. Optical properties in this region are expected to be sensitive to vibrational modes and absorption due to free carriers; and spectroscopic ellipsometry can also be used to deduce layer thicknesses, interfacial formation, and gradients. In the THz regime, optical properties approach the DC limit, thus they can be used to extrapolate electrical properties of materials (carrier concentration, mobility, etc.). The ability to extract electrical properties from a non-contacting optical measurement is particularly attractive for probing materials in device structures or where traditional electrical characterization is difficult including photovoltaic materials and devices; microbolometer materials for uncooled infrared sensors; structured materials including nanoparticle films, carbon nanotube films, metamaterials, and engineered thin films; ferroelectrics and other oxide materials; thin film transistors; and, polymer thin films.The THz Spectroscopic Ellipsometer at the University of Toledo will assist in graduate and undergraduate student research, as well as enabling collaborations between researchers at other universities, government laboratories, and industry, in uncovering connections between optical, electrical, and structural properties of materials. It is believed to be the only tool of its kind available on both a user fee and collaborative basis and is expected to provide new opportunities and further develop networks of measurement and analytical expertise. Research resulting from THz spectroscopic ellipsometry has strong potential to uncover new fundamental information and will enhance the knowledge base of physical mechanisms in materials and devices for technological (component layers in electronic circuits), security (chemical and infrared sensors), and energy (photovoltaics) applications. Simultaneously, it will enable the research training of the next generation of scientists and engineers, who will further develop its capabilities and apply them in exploring new research areas.