Elementary deformation processes in single crystal superalloys (A02)

项目A2使用透射电子显微镜（TEM）研究基本变形过程。它探讨了位错，堆垛层错，反相界，微孪晶和剪切带的物理本质及其在高温变形过程中的作用。A2侧重于应用TEM衍射对比度研究来分析缺陷，进一步利用第二个资助期开发的3D TEM立体方法，并将新开发的高分辨率EBSD SEM方法转移到TEM。

Project A2 uses transmission electron microscopy (TEM) to study elementary deformation processes. It explores the physical nature of dislocations, stacking faults, anti phase boundaries, micro twins and shear bands and their role during high temperature deformation. A2 focusses on applying TEM diffraction contrast studies to analyze defects, on further exploiting the 3D TEM stereo method developed in the second funding period and on transferring the newly developed high resolution EBSD SEM-method to TEM.