MRI: Acquisition of Atomic and Magnetic Force Microscopy

MRI：原子力显微镜和磁力显微镜的采集

• 批准号: 1337339
• 负责人: Dereje Seifu
• 金额: $ 4.6万
• 依托单位: Morgan State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-09-15 至 2016-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1337339&HistoricalAwards=false
• 关键词: MRI; Acquisition; Atomic; Magnetic; Force

This award by the National Science Foundation to Morgan State University is for the acquisition of a combined atomic force and magnetic force microscope (AFM/MFM). This instrument will be used to probe the underlying physics and characterize thin magnetic films and multi-layers. In recent years, the PI has developed novel lower-dimensional solid state structures with optical, electronic, and magnetic characteristics governed by quantum mechanics. Probing the size effects and surface and interfacial physics is important in understanding these structures and developing new technologies. The AFM/MFM provides information on features as small as an atomic lattice for either conductive or non-conductive samples, it enables manipulation for sample growth, and it makes it possible to image in in-situ and controlled environments. The ability to probe materials with Atomic and Magnetic Force Microscopy (AFM/MFM) is critical in understanding the physics of novel thin film magnetic materials a few nanometers thick and a few square millimeters in surface area. The instrument will be used to study technologically important materials used in ultra-high-density data storage for next generation personal computers and in developing fast, miniaturized, and reliable electronic devices. The instrument will complement an existing magneto-optic Kerr effect instrument and magnetron sputtering thin film growth system. Students at Morgan will learn the basics of operating and building an AFM / MFM through a weeklong workshop at the manufacturer's headquarters. This knowledge will enable modification of the instrument to advance a variety of research needs and will be passed on to future students at Morgan State University.

美国国家科学基金会授予摩根州立大学的这一奖项是为了表彰他们获得了一种原子力和磁力相结合的显微镜（AFM/MFM）。 该仪器将用于探测基本物理和表征磁性薄膜和多层。 近年来，PI已经开发出新颖的低维固态结构，具有量子力学控制的光学，电子和磁性特性。 探索尺寸效应和表面和界面物理对于理解这些结构和开发新技术非常重要。 AFM/MFM为导电或非导电样品提供了小至原子晶格的特征信息，它可以操纵样品生长，并且可以在原位和受控环境中成像。 用原子力和磁力显微镜（AFM/MFM）探测材料的能力对于理解几纳米厚和几平方毫米表面积的新型薄膜磁性材料的物理特性至关重要。 该仪器将用于研究下一代个人计算机超高密度数据存储和开发快速，小型化和可靠的电子设备中使用的技术重要材料。 该仪器将补充现有的磁光克尔效应仪器和磁控溅射薄膜生长系统。 摩根的学生将通过在制造商总部为期一周的研讨会学习操作和构建AFM / MFM的基础知识。这些知识将使仪器的修改，以推进各种研究需求，并将传递给未来的学生在摩根州立大学。