Charge Distribution and Interaction Forces at Interfaces: High Resolution Detection and its Application towards the Controlled Formation of Mesoscopic Structures (C04)

界面处的电荷分布和相互作用力：高分辨率检测及其在介观结构受控形成中的应用（C04）

• 批准号: 212820158
• 金额: --
• 依托单位: Arbeitsgruppe Physikalische Chemie II
• 依托单位国家: 德国
• 项目类别: Collaborative Research Centres
• 财政年份: 2011
• 资助国家: 德国
• 起止时间: 2010-12-31 至 2020-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/212820158?language=en
• 关键词: Charge; Distribution; Interaction; Forces; Interfaces

In project C04 new probe microcopy methods will be developed for studying the interaction between single building blocks of mesoscopic systems. The inter-particle force and adhesion of nanoparticles are of particular interest for the industrial applications of colloidal suspensions. To measure such interactions, we will develop on the base new instrumental approaches on the base of a combination of atomic force microscopy (AFM) and nanofluidics. With the same setup, also the interaction force in other colloidal systems can be determined quantitatively, for example during the exfoliation of silicate platelets. for the preparation of colloidal probes that are used in direct force measurements with the atomic force microscope (AFM). Electrostatic forces due to local charge distributions are particularly long-ranged. Therefore, those will be studied closely by other probe microscopy techniques.

在项目C04中，将开发新的探针显微镜方法，用于研究介观系统的单个构件之间的相互作用。纳米颗粒的颗粒间力和粘附力对于胶体悬浮液的工业应用特别感兴趣。为了测量这种相互作用，我们将在原子力显微镜（AFM）和纳米流体相结合的基础上开发新的仪器方法。利用相同的设置，也可以定量地确定其他胶体系统中的相互作用力，例如在硅酸盐片层的剥离期间。用于制备用于原子力显微镜（AFM）直接力测量的胶体探针。由于局部电荷分布而产生的静电力是特别长程的。因此，这些将通过其他探针显微镜技术进行密切研究。