Charge Distribution and Interaction Forces at Interfaces: High Resolution Detection and its Application towards the Controlled Formation of Mesoscopic Structures (C04)

在C04项目中，将开发新的探针显微复制方法来研究介观系统中单个构件之间的相互作用。颗粒间的作用力和纳米颗粒的粘附性对胶体悬浮液的工业应用特别感兴趣。为了测量这种相互作用，我们将在原子力显微镜（AFM）和纳米流体学相结合的基础上开发新的仪器方法。通过同样的设置，也可以定量地确定其他胶体系统中的相互作用力，例如在硅酸盐薄片剥落过程中。用于制备用于原子力显微镜（AFM）直接力测量的胶体探针。由局部电荷分布引起的静电力的作用范围特别长。因此，这些将被其他探针显微镜技术密切研究。

In project C04 new probe microcopy methods will be developed for studying the interaction between single building blocks of mesoscopic systems. The inter-particle force and adhesion of nanoparticles are of particular interest for the industrial applications of colloidal suspensions. To measure such interactions, we will develop on the base new instrumental approaches on the base of a combination of atomic force microscopy (AFM) and nanofluidics. With the same setup, also the interaction force in other colloidal systems can be determined quantitatively, for example during the exfoliation of silicate platelets. for the preparation of colloidal probes that are used in direct force measurements with the atomic force microscope (AFM). Electrostatic forces due to local charge distributions are particularly long-ranged. Therefore, those will be studied closely by other probe microscopy techniques.