Integrated GD-OES/XRF element analyzer (GD-OES = glow discharge optical emission spectroscopy, XRF = X-ray fluorescene)

集成 GD-OES/XRF 元素分析仪（GD-OES = 辉光放电发射光谱，XRF = X 射线荧光）

• 批准号: 414179996
• 金额: --
• 依托单位: Arbeitsgruppe Experimentelle Physik
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2019
• 资助国家: 德国
• 起止时间: 2018-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/414179996?language=en
• 关键词: Integrated; GD; OES; XRF; element

Quantitative element analysis plays a central role in many fields of physics, material science and engineering. In the following, typical application examples of the applying working groups at the University of Duisburg-Essen are given:When researching novel materials for renewable energies, it is essential to know thicknesses and composition of the fabricated thin films, in particular of the absorber layers. In order to arrive at precise statements about the device quality, it is equally important to obtain information about the depth-dependent element distribution, in particular for multinary materials like chalkoyprites (researched by AG Schmid) or perovskites (AG Kirchartz, AG Lupascu, AG Winterer). Also for magnetic heterostructures made from multiferroic materials the composition is decisive. Multiphase nanocomposite layers like CoFe2O4/BaTiO3 are currently under research by the involved groups AG Wende and AG Lupascu. Nanoparticles of multiferroic nature (AG Wende, AG Lupascu) or based on nitrides and oxides for the application in photocatalysis (AG Winterer) are a subject of research, which basis on the knowledge of their composition. Finally, for oxides (Al2O3, ZrO2) doped with rare earth elements or transition metals (Cr, Eu, Tb) the concentration and distribution of doping ions within the lattice are determining for example the thermographic properties and are analyzed by the AG Atakan.The broadness of the mentioned examples illustrates the necessity of covering a broad spectrum of elements. At the same time, a resolution down to the ppm range shall be reached. For this, on the one hand side the integral composition values of solid, powder and where necessary liquid samples are of interest. On the other hand, for solid samples, in particular thin films, the depth-dependent element distribution is relevant.As measurement methods, which allow a quick analysis over a depth of up to several micrometers with a measurements precision in the range of few ppm, two methods offer themselves: X-ray fluorescence (XRF) for integral values also of powder and liquid samples and glow-discharge optical emission spectroscopy (GD-OES) for depth-resolved results of solid samples. Measurements using energy-dispersive XRF are non-destructive and available starting from the element Na. GD-OES in contrast measures in an abrasive way, but provides access to the light elements like C, O and N. The combination of the two methods XRF and GD-OES allows an optimal coverage of a broad element spectrum under minimal compromises of precision and non-destructiveness. The integrated version additionally facilitates a cross calibration to obtain reliable quantitative values. A thorough calibration is the basis for meaningful measurements, which are expected from the proposed integrated GD-OES/XRF element analyzer.

定量元素分析在许多物理，材料科学和工程领域都起着核心作用。在下面，给出了杜伊斯堡大学应用工作组的典型应用示例：在研究新颖的可再生能量材料时，必须了解制造的薄膜的厚度和组成，尤其是吸收层的层。为了获得有关设备质量的精确陈述，获得有关深度依赖性元件分布的信息，特别是对于诸如Chalkoyprites（由AG Schmid）或perovskites（Ag Kirchartz，Ag Kirchartz，Ag Lupascu，Ag Winterer）等多属材料（由AG Schmid进行了研究）也很重要。同样，对于由多效材料制成的磁异构结构，组成是决定性的。涉及的Ag Wende和Ag Lupascu目前正在研究中，如COFE2O4/BATIO3这样的多相纳米复合层。多效性质（Ag Wende，ag lupascu）或基于氮化物和氧化物的纳米颗粒（AG Winterer）是研究的主题，基于其组成的知识。最后，对于氧化物（Al2O3，Zro2），用稀土元素或过渡金属（CR，EU，TB）掺杂的氧化物（cr，eu，tb），格子内掺杂离子的浓度和分布正在确定例如热力计特性，例如由AG Atakan分析。同时，应达到PPM范围的分辨率。为此，一方面是固体，粉末和必要时液体样品的积分组成值。另一方面，对于固体样品，特别是薄膜，与深度依赖性元素分布相关。作为测量方法，它可以快速分析多达几微米的深度，并在几个ppm的范围内进行测量精度，两种方法提供了两种方法：X射线液体（XRF）对于X射线液体（XRF）以及粉末式和液体式（XRF）的粉末和GLOW-DISCHUSILE（XRF），以及GLOW-DISCHUSILE（XRF） - iSCHUSIDERISE（XRF） - iSCHUSIDERISE;固体样品的深度分辨结果。使用能量分散XRF的测量是无损的，从元素Na开始。相反，GD-OE以磨料的方式进行了造影剂，但可以访问C，O和N等光元素。两种方法XRF和GD-OES的组合允许在最小的精确性和无毁灭性的最小化损害下对宽元素频谱的最佳覆盖。集成版本还促进了交叉校准以获得可靠的定量值。彻底的校准是有意义的测量的基础，这是从提出的集成GD-OES/XRF元素分析仪中期望的。