Formation mechanism of the segregation layer of reactive metals to the bonding interface in brazing alloy joining for metal/ceramics and structure cotrol of joining

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(1) Generation of like thermally stimulated current (TSC) was observed by using the couple was consisted ceramics/metal at elvated temperature. Metals were used Al, Cu, Ti, Pt, W and Mo. Ceramicses were used SiC, Al_2O_3, ZrO_2, Si_3N_4, AlN and ZrB_2. These ceramics/metal couples are generated electromotive force which is differntly character as conventional thermally EMF at elevate temperature. These temperature were observed from adjacent to increasing of electroconductivity of ceramics. These polarization curves has been depended temperature but has been maximum EMF. EMF are held always negative potential on side of ceramics above brazing TEMP. As 1100 k.(2) Reactive element are segregated on the interface of ceramics by using brazers which is included reactive metal such as VI a family Ti, Zr, Hf.(3) For explain these segregation mechanism, we are assumed that these EMF be made make driving force are generated ag brazing TEMP. . Then we are added electric field from out side of couple. Segregation of reactive metals are disappeared by ceramics are made positive pole. Reverse are segregated. Therefore, we are explained that segregation to the interface of ceramics are caused by generation of peculiary thermally EMF on interface ceramics/metal couple.(4) Thickness of segragation layer are controlled by outside electric field with small current. Namely, thickness of layer are propotionaly depended by factors of current and time. TEMP. Are not depended.