X-Ray Diffraction Studies of 2D Materials (B02)
X-Ray Diffraction Studies of 2D Materials (B02)
二维材料的 X 射线衍射研究 (B02)
批准号：
443792851
负责人：
金额：
$0.0万
依托单位国家：
德国
项目类别：
Collaborative Research Centres
财政年份：
2020
资助国家：
德国
项目状态：
已结题
起止时间：
2019-12-31 至 2023-12-31
中文摘要
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英文摘要
Geck’s project will determine the global average structure and local structural deviations for synthetic 2DMs by means of advanced surface X-ray diffraction techniques. Furthermore, the morphology of these materials will be characterized in terms of texture as well as domain and grain sizes. These experiments shall be done on few- and even monolayer systems, such as Zr-based MOFenes. To this end, surface X-ray diffraction will be combined with studies of the pair distribution function and diffuse scattering.
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