X-Ray Diffraction Studies of 2D Materials (B02)

二维材料的 X 射线衍射研究 (B02)

• 批准号: 443792851
• 金额: --
• 依托单位: Professur für Physik der Quantenmaterialien
• 依托单位国家: 德国
• 项目类别: Collaborative Research Centres
• 财政年份: 2020
• 资助国家: 德国
• 起止时间: 2019-12-31 至 2023-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/443792851?language=en
• 关键词: Ray; Diffraction; Studies; 2D; Materials

Geck’s project will determine the global average structure and local structural deviations for synthetic 2DMs by means of advanced surface X-ray diffraction techniques. Furthermore, the morphology of these materials will be characterized in terms of texture as well as domain and grain sizes. These experiments shall be done on few- and even monolayer systems, such as Zr-based MOFenes. To this end, surface X-ray diffraction will be combined with studies of the pair distribution function and diffuse scattering.

Geck的项目将通过先进的表面X射线衍射技术确定合成2DM的全局平均结构和局部结构偏差。此外，这些材料的形态将在纹理以及域和晶粒尺寸方面进行表征。这些实验应在少数甚至单层系统上进行，例如Zr基MOFenes。为此，表面X射线衍射将与对分布函数和漫散射的研究相结合。