Towards Atomic Resolution Transmission Electron Microscopy Imaging of Electron-Beam-Sensitive Organic 2D Materials (B03)

点击翻译按钮获取中文摘要

This project will target at aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) imaging of organic 2DMs (2DPs, 2D MOFs, 2D COFs) with near-atomic or even atomic resolution. Near-atomic/atomic resolution will be achieved by a systematic optimization of the acceleration voltage and sample preparation techniques. With the assistance of theoretical modelling, the formation mechanisms of defects, grain boundaries, surface reconstructions, as well as defect-property correlations will be elucidated. Time-dependent ex-situ and in-situ observation will provide insights into the crystallization and growth mechanisms of organic 2DMs.