Towards Atomic Resolution Transmission Electron Microscopy Imaging of Electron-Beam-Sensitive Organic 2D Materials (B03)

电子束敏感有机二维材料的原子分辨率透射电子显微镜成像 (B03)

• 批准号: 443793239
• 金额: --
• 依托单位: Zentrale Einrichtung Elektronenmikroskopie
• 依托单位国家: 德国
• 项目类别: Collaborative Research Centres
• 财政年份: 2020
• 资助国家: 德国
• 起止时间: 2019-12-31 至 2023-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/443793239?language=en
• 关键词: Towards; Atomic; Resolution; Transmission; Electron

This project will target at aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) imaging of organic 2DMs (2DPs, 2D MOFs, 2D COFs) with near-atomic or even atomic resolution. Near-atomic/atomic resolution will be achieved by a systematic optimization of the acceleration voltage and sample preparation techniques. With the assistance of theoretical modelling, the formation mechanisms of defects, grain boundaries, surface reconstructions, as well as defect-property correlations will be elucidated. Time-dependent ex-situ and in-situ observation will provide insights into the crystallization and growth mechanisms of organic 2DMs.

该项目将针对有机2DM（2DPS，2D MOF，2D COF）的异常校正的高分辨率透射电子显微镜（AC-HRTEM）成像，具有接近原子甚至原子分辨率。通过系统优化加速度电压和样品制备技术，将实现近原子/原子分辨率。在理论建模的帮助下，将阐明缺陷，晶界，表面重建以及缺陷 - 托管相关性的形成机制。时间依赖性的前态和原位观察将提供有关有机2DM的结晶和生长机理的见解。