Meso-scale Nondestructive Observation System of Self-organized Dislocation Network using Scanning Electron Acoustic Microscopy
Meso-scale Nondestructive Observation System of Self-organized Dislocation Network using Scanning Electron Acoustic Microscopy
批准号:
12555028
负责人:
SHIBUTANI Yoji
金额:
$5.57万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2001
中文摘要
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英文摘要
In order to investigate internal structures generated by self-organized dislocation network in various kinds of materials and loading states, we have developed a nondestructive observation system using acoustic wave by the electron beam. In this system, heat wave is firstly generated on the surface of the specimen by the irradiation of blanking and focused electron beam of the Scanning Electron Microscope (SEM). Then the heat wave is transferred into sound wave, and it propagates within the specimen as elastic wave. Difference of the local thermal property of the material is converted into an electric signal by a piezoelectric transducer (PZT) attached onto the back side of the specimen. This system is called the scanning electron acoustic microscopy (SEAM). It makes us enable to observe both the surface of the specimen by SEM mode and the nondestructive inside structure by SEAM. A commercial amplifier is not enough to detect the electric signals by the PZT, because these signals are very feeble and high frequency. We developed a newly head amplifier using transistors. This head amplifier transforms an impedance and amplifies the electric signals. And we used an instrumentation amplifier to eliminate the noises from detected signals. Then the detected signals are amplified by a lock-in amplifier synchronized to the blanking frequency of an electron beam. The performance of this developed head amplifier seems to be excellent and it makes us enable to detect the electron acoustic signals sufficiently.We obtained ultrasonic signal by the SEAM using the Diamond Like Carbon (DLC) thin film laminated on single crystalline silicon wafer. And we developed a portrayal system that draws these signals as two dimensional phase-contrast images on the display.
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永原直哉, 小山敦弘, 渋谷陽二: "FIB-TEMによるインデンテーション直下の内部構造の観察と微小硬度評価"日本機械学会関西支部 第77期定時総会講演会講演予定.
Naoya Nagahara、Atsuhiro Koyama、Yoji Shibuya:“使用 FIB-TEM 观察压痕正下方的内部结构并评估显微硬度” 预定在日本机械工程学会关西分会第 77 届年度大会上发表演讲。
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A. Koyama, N. Nagahara, M. Tanno, Y. Shibutani and Y. Tomita: "Estimation of Strength of DLC Thin Film under Indentation"Proceedings of Mechanical Engineering Congress, 2001. Vol. 1. 275 (2001)
A. Koyama、N. Nagahara、M. Tanno、Y. Shibutani 和 Y. Tomita:“压痕下 DLC 薄膜强度的估计”机械工程大会论文集,2001 年。
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渋谷陽二, 青野芳大, 小山敦弘: "シリコンのインデンテーション下での転位網の発達-分子動力学シミュレーションによる転位ループの解析-"第14回計算力学講演会講演論文集. 01-10. 69-7 (2001)
Yoji Shibuya、Yoshihiro Aono、Atsuhiro Koyama:“硅压痕下位错网络的发展 - 通过分子动力学模拟分析位错环”第 14 届计算力学会议论文集 01-10(2001)。
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渋谷陽二, 青野芳大, 小山敦弘: "シリコンのインデンテーション下での転位網の発達 -分子動力学シミュレーションによる転位ループの解析-"第14回計算力学講演会講演論文集. 01-10. 69-70 (2001)
Yoji Shibuya、Yoshihiro Aono、Atsuhiro Koyama:“硅压痕下位错网络的发展 - 通过分子动力学模拟分析位错环”第 14 届计算力学会议论文集 01-10(2001)。
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Y. Shibutani, Y. Aono and A. Koyama: "Development of Dislocation Network in Silicon under Indentation - Analyses of Dislocation Loop by Molecular Dynamics -"Proceedings of The 14th Computational Mechanics Conference. 01-10. 69 (2001)
Y. Shibutani、Y. Aono 和 A. Koyama:“压痕下硅中位错网络的发展 - 通过分子动力学分析位错环 -”第 14 届计算力学会议论文集。
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