Development of a Novel Ion-Current Semiconductor Detector for Distinguishing Incident Ions and Electrons

为了分析开场等离子体中的端损离子能量，根据金属收集器二次电子发射的“自收集”原理，提出了一种新型的静电离子能谱仪。离子能谱仪设计了用于分析入射离子能量的多个栅格，以及一组相对于开放式装置中的环境磁力线平行放置的金属板。这台光谱仪最重要的特性之一是使用我们提出的由于接地的金属板收集器发射的二次电子产生E×B漂移而产生的“自收集”机制的原理，除了周围的开放式磁场B之外，不使用任何额外的磁系统。原理证明和表征实验是通过使用测试离子束线和附加使用亥姆霍兹线圈系统来进行的，以形成类似于伽马10端区的开放磁场。在电子回旋加热产生的高能电子同时入射形成端损堵塞势的条件下，展示了所研制的用于端损离子诊断的离子能谱仪在伽马10等离子体实验中的应用，因为这些电子有助于干扰来自传统端损离子探测器的这些离子信号。

For the purpose of end-loss-ion energy analyzes in open-field plasmas, a newly developed electrostatic ion-energy spectrometer is proposed on the basis of a "self-collection" principle for secondary electron emission from a metal collector. The ion-energy spectrometer is designed with multiple grids for analyzing incident ion energies, and a set of parallelized placed metal plates with respect to lines of ambient magnetic forces in an open-ended device. One of the most important characteristic properties of this spectrometer is the use of our proposed principle of a "self-collection" mechanism due to E×B drifts for secondary electrons emitted from the grounded metal-plate collector by the use of no further additional magnetic systems except the ambient open-ended fields B. The proof-of-principle and characterization experiments are carried out by the use of a test-ion-beam line along with an additional use of a Helmholtz coil system for the formation of open magnetic fields similar to those in the GAMMA 10 end region. The applications of the developed ion-energy spectrometer for end-loss-ion diagnostics in the GAMMA 10 plasma experiments are demonstrated under the conditions with simultaneous incidence of energetic electrons produced by electron-cyclotron heatings for end-loss-plugging potential formation, since these electrons have contributed to disturb these ion signals from conventional end-loss-ion detectors.