A study for feature extraction method of color image using color histogram space and its applications

在17个财政年度所做的主要研究如下。（1）基于颜色频率信息的高精度彩色纹理图像分割方法的研究为了实现彩色纹理图像的高精度分割，必须正确地检测纹理边缘。本文提出了利用颜色直方图特征从小范围内正确检测纹理边缘的方法。如果检测到最佳纹理边缘，则该技术将应用其中包含在小区域中的颜色数变为最大的字符。（2）开发利用颜色直方图改善彩色图像中的局部曝光的方法本研究开发了对在实际看到人的图片中存在像在背光下拍摄的图片那样的极亮部分和暗部分的数字图像进行校正的技术。该技术通过使用所获取的图像自动创建亮度与之不同的一个图像，并且使用两个图像的该色频率信息来执行图像的曝光补偿。该方法已申请专利。（3）利用多光谱光谱仪进行缺陷检测的研究利用多光谱仪对光线进行频率分解，可以获得传统RGB信息所不能获得的颜色特征，发展了我们所开发的缺陷检测技术，其执行频率信息应用并且难以发现其到该多个-频谱特征，对这种多频谱特征进行频率信息应用，发展了难以发现的缺陷检测技术。

The main researches done in the 17 fiscal year are as follows.(1)Development of color texture image segmentation method with high accuracy using color frequency informationIt is necessary to detect texture edge correctly for highly precise segmentation of a color texture image. This research develops the method of detecting texture edge from the small area where edge exists correctly using the color histogram feature. This technique will have applied the character in which the color number contained in a small area becomes the maximum, if the optimal texture edge is detected.(2)Development of a method of improving local exposure in color image using a color histogramThis research develops the technology which rectifies the digital image with which an extremely bright portion and a dark portion exist like the picture taken under the backlight in a picture in which man is actually seen.This technique creates automatically one image from which brightness differs by using an acquired image, and performs exposure compensation of a image using this color frequency information of two images. This method is among patent application now.(3)Development of defect detection by using multi-spectrum spectroscopeThe multiple spectrum which carried out frequency decomposition of the light can acquire the color feature which was not acquired for the conventional RGB information.This research develops the technique of detecting the defect which we developed, which carries out frequency information application and which is hard to find it to this multiple-spectrum feature.Frequency information application is carried out to this multiple-spectrum feature, and this research develops the technique of detecting the defect which is hard to find it.