Correlative optomechanical microscope

该提案的目标是组装一种设备，可以对单个纳米颗粒进行荧光显微镜和光谱分析，并（同时）使用原子力显微镜（AFM）进行探测/操作。该装置将针对近红外荧光纳米材料（如碳纳米管或纳米片）的荧光信号进行优化。它包含一个可调谐的激光光源，以激发不同类型的纳米材料和荧光团。光信号可以在近红外光谱和可见光光谱范围内检测到，并且可以获得空间（成像）和光谱信息。在倒置光学装置的顶部放置一个原子力显微镜（AFM）。它使纳米材料的尺寸和几何成像和机械操作成为可能。因此，该设置提供了有关所研究系统的光学和机械信息。这种相关的设置使得对荧光材料的光物理及其界面的动力学/结构有价值的见解。

The goal of the proposal is to assemble a device that enables fluorescence microscopy and spectroscopy of single nanoparticles and (simultaneous) probing/manipulation with an atomic force microscope (AFM). The setup will be optimized for fluorescence signals from near infrared fluorescent nanomaterials such as carbon nanotubes or nanosheets. It contains a tunable laser light source to excite different types of nanomaterials and fluorophores. The optical signals can be detected in the near infrared and the visible range of the spectrum and both spatial (imaging) and spectroscopic information can be obtained. On top of the inverted optical setup an Atomic Force Microscope (AFM) is placed. It enables both imaging of size and geometry of nanomaterials and mechanical manipulation. The setup provides consequently both optical and mechanical information about the investigated systems. This correlative setup enables valuable insights into photophysics of fluorescent materials and dynamics/structure of their interfaces.