Correlative optomechanical microscope

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The goal of the proposal is to assemble a device that enables fluorescence microscopy and spectroscopy of single nanoparticles and (simultaneous) probing/manipulation with an atomic force microscope (AFM). The setup will be optimized for fluorescence signals from near infrared fluorescent nanomaterials such as carbon nanotubes or nanosheets. It contains a tunable laser light source to excite different types of nanomaterials and fluorophores. The optical signals can be detected in the near infrared and the visible range of the spectrum and both spatial (imaging) and spectroscopic information can be obtained. On top of the inverted optical setup an Atomic Force Microscope (AFM) is placed. It enables both imaging of size and geometry of nanomaterials and mechanical manipulation. The setup provides consequently both optical and mechanical information about the investigated systems. This correlative setup enables valuable insights into photophysics of fluorescent materials and dynamics/structure of their interfaces.