课题基金 / 基金详情

Development of fundamental technique on high resolution electron microscopy and its applications

Development of fundamental technique on high resolution electron microscopy and its applications
高分辨电子显微镜基础技术发展及其应用
批准号:
01300010
负责人:
MIHAMA Kazuhiro
金额:
$8.0万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Co-operative Research (A)
财政年份:
1989
资助国家:
日本
项目状态:
已结题
起止时间:
1989 至 1991

项目摘要

项目成果

MIHAMA Kazuhiro的其他基金

相似基金

相关文献

中文摘要
翻译
点击翻译按钮获取中文摘要
英文摘要
This year is the last one for the present project continued three years. High voltage electron microscope is superior in the following characteristics in comparison with conventional electron microscope with the accerelating voltage of around 200 kV : (1) high resolution, (2) hogh penetration power, (3) facility of in-situ experiments, (4) study on the radiation damage, etc. In the last three years, several distinguished results in a field of the instrumentation as well as the application, such as high resolution electron microscopy, radiation damage, in-situ experiments including the creation of new materials by using the high energy electrons as "mini-labo" have been carried out. Furthermore, high voltage electron microscopes were renewed at several universities, Kyoto University, Tohoku University, Tokyo University and Osaka University. Accordingly, we expect the new developement on the high voltage electron microscopy in a wide field of materials science as well as the biological science.In 1991, it was held the meeting at 28th and 29th, November 1991 in Nagoya Kosei-nenkin Kaikan and discussed on the future plan of high voltage electron microscopy at each university and institution besides the presentation of recent research works. These results was summerized in the annual report of 1991.
期刊论文(34)
专著(0)
科研奖励(0)
会议论文
M. Hibino: "Side-entry type foil lens for correction of spherical aberration of probe-forming lens"
M. Hibino:“用于校正探头形成透镜的球面像差的侧入式箔透镜”
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
N.Tanaka: "Observation by HVEM of atomic clusters embebded in MgO crystals" Ultramicroscopy. 39. 395-402 (1991)
N.Tanaka:“通过 HVEM 观察嵌入 MgO 晶体中的原子团簇”超显微术。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
Y.Ishida: "Structural Feature to Relax Thermal Stress at Mctal/Ceramics Joined Interface" ISII International. 30. 1041-1045 (1990)
Y.Ishida:“缓解 Mctal/陶瓷连接界面热应力的结构特征”ISII International。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
Y.Kamiya: "Granularity Noise of Photographic Emulsions-Accuracy of Inteusity Measuremeut by Photographic Plates" J.Eleclron Microsc.39. 351-355 (1990)
Y.Kamiya:“照相乳剂的粒度噪声 - 通过照相板测量 Inteusity 的准确性”J.Eleclron Microsc.39。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
34
    Preparation of quasicrystalline particles with uniform size
    • 批准号:
      04650026
    • 项目类别:
      Grant-in-Aid for General Scientific Research (C)
    • 资助金额:
      $1.28万
    • 财政年份:
      1992
    • 负责人:
      MIHAMA Kazuhiro
    • 依托单位:
    Structure and Property of Single Crystalline MgO Films Embedded Fine Metal Crystallites
    • 批准号:
      61420018
    • 项目类别:
      Grant-in-Aid for General Scientific Research (A)
    • 资助金额:
      $24.0万
    • 财政年份:
      1986
    • 负责人:
      MIHAMA Kazuhiro
    • 依托单位:
    海外基金