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High resolution and rapid observations of transmission electron microscope with TV-camera and image processing system and their mineralogical applications

电视摄像机和图像处理系统透射电子显微镜的高分辨率快速观察及其矿物学应用

基本信息

批准号：
02554029
负责人：
OKUNO Masayuki
金额：
$ 6.46万
依托单位：
Kanazawa University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Developmental Scientific Research (B)
财政年份：
1990
资助国家：
日本
起止时间：
1990 至 1992
项目状态：
已结题

项目摘要

In this study we established a method for TEM observation by high-sensitive CCD camera and image processing system in order to carry out high-resolution and rapid observation of micro structures in minerals. The following results were obtained.1, In 1990, a TV system was attached to TEM. By using this TV system, we obtained high resolution images with high magnification as same as images obtained by film method. By the TV system with VTR, we realized to record many TEM images in a short time.2, In 1991, a image processing system was added the TV system, it enable to improve images. We measured electron diffraction intensities of SiO_2 glass. And, we observed and recorded dislocation images in the deformed quartz in quantity and successive changes of the dislocations by electron irradiation.3, In 1992, we used this system for student practice in order to explian TEM. This TV system enabled to show many students TEM images.These result were arranged for a report volume. We expect that this report is useful for other investigators.These results indicate the usefulness of this system for imaging of electron radiation-sensitive samples and recording of a large quantity of images. We expect improvements of this type system by using slow scan CCD camera or high-vision camera in furture and also expect many possibilities of imaging by applying image processing techniques.

本研究建立了一种利用高灵敏度CCD摄像机和图像处理系统进行透射电镜观察的方法，以实现对矿物微观结构的高分辨率、快速观察。1，1990年在TEM上安装了电视系统。利用该电视系统，我们获得了与胶片法相同的高分辨率、高放大率的图像。1991年，在电视系统中增加了一个图像处理系统，它使图像得到改善。我们测量了SiO_2玻璃的电子衍射强度。并在形变石英中观察记录了位错的图像，以及电子辐照位错的连续变化。3、1992年，我们将该系统用于学生实习，以解释TEM。该电视系统可以显示许多学生的TEM图像。这些结果被安排成一个报告卷。这些结果表明该系统可用于电子辐射敏感样品的成像和大量图像的记录。我们期望这种类型的系统的改进，通过使用慢扫描CCD相机或高视觉相机在未来，也期望通过应用图像处理技术成像的许多可能性。