Scanning Capacitance microscope
Scanning Capacitance microscope
批准号:
02555081
负责人:
TAMURA Shinichi
金额:
$4.35万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Developmental Scientific Research (B)
财政年份:
1990
资助国家:
日本
项目状态:
已结题
起止时间:
1990 至 1992
中文摘要
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英文摘要
The objective of this research is to develop a scanning capacitance microscope which has although lower resolution power than STM and electron microscope, but has higher resolution power than optical microscope. Then, it can provide images of objects coarser than those the former deals with and finer the latter deals with. Thus, it can be used as a zoom up function of an optical microscope, for example. There are several choices to realize it. We built a scanning capacitance microscope according to the following investigated results:(1) Scanning method: There are two types of scanning. One is stage driving method and the other is stylus driving method. We concluded that the latter is superior to the former from the view point of cross-talk noise and skewness.(2) Electro-static capacitance detection method: There are two types of the detection methods. One is a direct method and the other is differential capacitance method. We concluded that the latter is superior to the former from the … More view point of S/N ratio.(3) Additive vibration frequency: Initially 160 Hz was used as the additive vibration frequency of the differential capacitance method. Finally, however, 10 kHz is used, since the higher frequency is better from the view point of S/N ratio.(4) Signal detection method: There are two types of detection method. One is envelope detection method and the other is synchronous detection method. We concluded that the latter is superior to the former from the view point of S/N ratio and stability.(5) Z-axis driving method: There are two types of driving method. One is direct method which makes the detector output as the surface observation output image directly, and the other is 2.5 dimensional scanning method which outputs the stylus hight as the surface image when using hight-feedback so that the detector output is kept constant. We concluded that the latter is superior to the former from the view point of linearity and stability.Several images including metal and semiconductor surfaces are taken by using the microscope developed in this research. Less
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岡崎 耕三: "走査型静電容量顕徴鏡(scaM)の開発" 鳥取大学工学部研究報告. Vol22No1. 93-101 (1992)
冈崎幸三:“扫描电容显微镜(scaM)的发展”鸟取大学工学部研究报告第 93-101 卷(1992 年)。
DOI:
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发表时间:
期刊:
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作者:
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通讯作者:
金 應珪: "微分容量方式走査型顕微鏡" 1993年電子情報通信学会春季大会シンポジウム. (1993)
Kim Eong-gee:“差动电容扫描显微镜”1993年电子信息通信工程师学会春季会议研讨会(1993年)。
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作者:
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通讯作者:
金 應珪: "ステ-ジ駆動および針駆動微分容量方式走査型顕微鏡" 電子情報通信学会秋季全国大会. (1991)
Eong-gee Kim:“载物台驱动和针驱动差分电容扫描显微镜”IEICE 秋季全国会议(1991 年)。
DOI:
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影响因子:
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作者:
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通讯作者:
金 應珪: "ステージ駆動および針駆動微分容量方式走査型顕微鏡" 1991年電子情報通信学会春季全国大会. (7-106) (1991)
Eong-gee Kim:“载物台驱动和针驱动差分电容扫描显微镜”1991 年 IEICE 春季全国会议 (7-106) (1991)。
DOI:
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发表时间:
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影响因子:
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作者:
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通讯作者:
Eung-kyeu Kim: "Differential capacitance type scanning microscope, 1993 Spring Convention of the Institute of Electronics" Information, and Communication Engineers of Japan.
Eung-kyeu Kim:“差动电容式扫描显微镜,1993 年电子学会春季会议”日本信息和通信工程师。
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