课题基金 / 基金详情

Estimation of atomic displacement in a unit cell by means of convergent-beam elctron diffraction

Estimation of atomic displacement in a unit cell by means of convergent-beam elctron diffraction
通过会聚束电子衍射估计晶胞中的原子位移
批准号:
02650467
负责人:
TOMOKIYO Yoshitsugu
金额:
$1.34万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (C)
财政年份:
1990
资助国家:
日本
项目状态:
已结题
起止时间:
1990 至 1991

项目摘要

项目成果

TOMOKIYO Yoshitsugu的其他基金

相关文献

中文摘要
翻译
点击翻译按钮获取中文摘要
英文摘要
Large angle convergent-beam electron diffraction (LACBED) has been applied to determine structure factors, and following results have been obtained for alpha Al_2O_3.1. The extinction distance xi_<kappa> for g=0 0 6l for l*5 was found to be much larger than specimen thickness of 150-200 nm suggesting that the kinematical theory of electron diffraction can be applied.2. When convergent angle of the incident beam is so large that several reflections with l's from 5 to 9 may satisfy Bragg conditions simultaneously and the beam is illuminated onto a small area of specimen, intensities of the Braggreflections can be analyzed with the kinematical approximation.3. The position of Al ion in alumina was found to be displaced by 0.02435 nm along a C-axis from the ideal position. The static displacement thus evaluated is in good agreement with the one derived by using the dynamical theory of electron diffraction and those obtained by X-ray diffraction, demonstrating the adequateness of the present kinematical treatment.4. If the temperature factor is ignored in the analysis, the displacements of Al ion is over estimated by about 10%. An accuracy in measurements is improved when a specimen is cooled, since intensities of 0 0 6l reflections change more sensitively with the displacement of Al ion at lower temperature.5. In the present experiment neighboring reflections were compared to reduce errors originated from background intensities and from non-lineality of darkness of films. The accuracy will be improved and experiments will be easy provided imaging plates or a slow scan CCD camera will be used in place of films.
期刊论文(31)
专著(0)
科研奖励(0)
会议论文
S. Matsumura, T. Oboshi, K. Oki: "High-voltage electron diffraction study of structure factors of Pd and Pt" Ultramicroscopy. 39. 65-71 (1991)
S. Matsumura、T. Oboshi、K. Oki:“Pd 和 Pt 结构因素的高压电子衍射研究”超显微术。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
Y. Tomokiyo, T. Yoshino, Y. Suyama, T. Manabe, E, Tanaka: "High resolution electron microscopy of sintered YBa_2Cu_3O_<7 x>" Proc. 4th Int. Sympo. on Superconductivity. (1991)
Y. Tomokiyo、T. Yoshino、Y. Suyama、T. Manabe、E、Tanaka:“烧结 YBa_2Cu_3O_<7 x> 的高分辨率电子显微镜”Proc。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
Y. Tomokiyo, Y. Omori, T. Yoshino, T. Fujimoto: "Electron Diffraction of Sintered YBa_2Cu_3O_y and Detection of Local Variation of Oxygen Content" Proc. 6th Japan-China Seminar on EM. (1991)
Y. Tomokiyo、Y. Omori、T. Yoshino、T. Fujimoto:“烧结 YBa_2Cu_3O_y 的电子衍射和氧含量局部变化的检测”Proc。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
31
    Quantitative Analysis of Local Structure in High Tc Superconductors by Energy Filtering Convergent-Beam Electron Diffraction
    • 批准号:
      11450240
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $9.73万
    • 财政年份:
      1999
    • 负责人:
      TOMOKIYO Yoshitsugu
    • 依托单位:
    ELECTRON SPECTROSCOPIC MICROSCOPY IN MATERIALS SCIENCE
    • 批准号:
      10044166
    • 项目类别:
      Grant-in-Aid for Scientific Research (B).
    • 资助金额:
      $2.94万
    • 财政年份:
      1998
    • 负责人:
      TOMOKIYO Yoshitsugu
    • 依托单位:
    Quantitative analysis of gettering mechanism of Si device by using imagig plate and convergentbeam electron diffraction
    • 批准号:
      07455010
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $3.65万
    • 财政年份:
      1995
    • 负责人:
      TOMOKIYO Yoshitsugu
    • 依托单位: