Characterization of Photoelastic Modulator for Highly Sensitive Instrument for Measuring Optical Birefringence

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1. High performance photoelastic modulator (PEM) was made whose thickness is one half of an conventional one. A dynamic residual birefringence in optical element of PEM makes artifact signals combining with non-ideality of other optical elements, detector, and lock-in amplifier. Therefore, PEM whose optical element has small dynamic birefringence must be used. We succeeded in measuring correct circular dichroism spectra of standard samples from ultra violet to visible light range by using our new type PEM.2. Automatic measuring system for measurements of admittance parameters of PEM was made. IBM PC/XT, LCR meter, and frequency synthesizer are combined with GP-IB. Data analyses are made on IBM PC/AT compatible personal computer by using RS/I, which is high performance software for scientific data analysis.