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Trial production of the curved crystal spectrometer for soft X-Ray Raman scattering spectroscopy

软X射线拉曼散射曲面晶体光谱仪的试制

基本信息

批准号：
05554006
负责人：
NAKAI Shunichi
金额：
$ 10.24万
依托单位：
Faculty of Engineering Utsunomiya University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Developmental Scientific Research (B)
财政年份：
1993
资助国家：
日本
起止时间：
1993 至 1994
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-05554006/
关键词：
Soft X-Ray Specctrometer Soft X-Ray Raman Scattering Soft X-Ray Resonant Auger

项目摘要

1.Performance evaluation of the curved crystal spectrometer for soft X-Ray Raman scattering spectroscopy.(1) Performance test for precision and reliability of a scanning mechanism and resolution of the spectrometer. An electron beam was used as an excitation source. RAP(2d=26.12A)and ADP(2d=10.64A)crystals were used as an analyzing crystal.(2) Preparation of a program control for the speetrometer, data measuring and processing systems.Systems were controled by a personal computer (PC-9800).Measurement of the soft X-Ray Raman scattering spectra.We have measured Si-K_<alpha> Resonant X-Ray Emission Spectra (RXES) and Si-KLL Resonant Auger Spectra (RAS) in the vicinity of Si-K absorption edge for Si, SiO_2 and also Y-LMM RAS in Y-Lm absorption edge for Y metal, YF_3 and YCI_3. RXES were measureed at undulator beam line BL-2A of photon Factory. It is observed that the intensity of the spectra increases resonantly at the absorption peak energy and the peak energy exhibits linear dispersion as a function of incident photon energy. Moreover, these line shapes are asymmetry. Therefore these phenomena are owing to X-Ray resonant Raman scattering.

1.用于软X射线拉曼散射光谱的弯晶谱仪的性能评价。(1)扫描机构的精度和可靠性以及光谱仪的分辨率的性能测试。电子束被用作激发源。使用RAP（2d= 26.12 A）和ADP（2d= 10.64 A）晶体作为分析晶体。(2)本文介绍了软X射线拉曼散射谱的测量，测量了<alpha>Si的Si-K吸收边附近的Si-KLL共振X射线发射谱（RXES）和Si-KLL共振俄歇谱（RAS），并对实验结果进行了讨论。SiO_2和Y-LMM RAS在Y金属、YF_3和YCl_3的Y-Lm吸收边的吸收。RXES是在光子工厂BL-2A波荡器光束线上测量的。结果表明，在吸收峰能量处，谱线强度共振增加，峰能量随入射光子能量呈线性色散。此外，这些线的形状是不对称的。因此，这些现象是由于X射线共振拉曼散射。