Trial production of the curved crystal spectrometer for soft X-Ray Raman scattering spectroscopy

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1.Performance evaluation of the curved crystal spectrometer for soft X-Ray Raman scattering spectroscopy.(1) Performance test for precision and reliability of a scanning mechanism and resolution of the spectrometer. An electron beam was used as an excitation source. RAP(2d=26.12A)and ADP(2d=10.64A)crystals were used as an analyzing crystal.(2) Preparation of a program control for the speetrometer, data measuring and processing systems.Systems were controled by a personal computer (PC-9800).Measurement of the soft X-Ray Raman scattering spectra.We have measured Si-K_<alpha> Resonant X-Ray Emission Spectra (RXES) and Si-KLL Resonant Auger Spectra (RAS) in the vicinity of Si-K absorption edge for Si, SiO_2 and also Y-LMM RAS in Y-Lm absorption edge for Y metal, YF_3 and YCI_3. RXES were measureed at undulator beam line BL-2A of photon Factory. It is observed that the intensity of the spectra increases resonantly at the absorption peak energy and the peak energy exhibits linear dispersion as a function of incident photon energy. Moreover, these line shapes are asymmetry. Therefore these phenomena are owing to X-Ray resonant Raman scattering.