Research on Concentration of Soft X-ray emitted from Z-pinch

用玻璃科学研究所研制的X射线技术观测了日本大学喷气Z-箍缩装置发射的X射线辐射。喷气式Z-箍缩发射出波长较宽的强X射线。利用玻璃毛细管转换器和X射线光谱仪进行了观察，玻璃毛细管转换器选择性地传输波长大于1 nm的软X射线，并将其会聚在1 mm以内的一个光斑中。它对波长较短的硬X射线起到了滤光作用。利用这一特性，消除了外加电场加速高能电子发射的硬X射线的影响，观察到了热等离子体轮廓。在光谱中，同时使用了晶体薄膜和多层膜进行衍射。制作的光谱具有体积小、结构简单、更换晶体即可改变测量长度的特点。在晶体干涉仪上测量了3.4-4.6 nm和小于1 nm两个波长范围。这两个地区的辐射都是从特别不同的地方发出的。以往的测量表明，X射线辐射是在不同的场合和不同的地点发射的。目前的结果与此一致。后一种辐射是从与电极表面以外的不稳定性有关的热点发出的。在多层膜的光谱中，既观察到谱线，又观察到一维空间分布。由于我们的光谱图像是通过积分50-100次激发而获得的，所以特殊分布的轮廓是相当模糊的。然而，对于更亮的X射线源，将同时获得谱线和特殊轮廓。

The X-ray radiation emitted from the gas-puff Z-pinch device in Nihon University was observed by the X-ray technologies developed in the Scientific Institute of Technical Glass. The gas-puff Z-pinch emits intensive X-rays with a wide wave length. The observation was carried out by glass capillary converters and X-ray spectrometers.The glass capillary converter propagated selectedly the soft X-ray with longer wave length than 1 nm and converged it in a spot within 1 mm. It plays a role of filter for the hard X-ray with shorter wave length. Making use of this feature the thermal plasma profile was observed removing the effect of hard X-rays emitted by high energy electrons accelerated by the applied electric field.In the spectroscopy both crystal and multi-layr membrane were used for diffraction. The fabricated spectroscopy is small and simple, and it is easy to change the measuring length by replacing a crystal. In the crystal interferometer two wave length regions, 3.4-4.6 nm and less than 1 nm, were measured. Both regions of radiation were emitted from specially different place. The previous measurement showed that the X-ray radiation was emitted in different instance and from different place. The present result was consistent of it. The latter radiation was emitted from the hot spot relating with instabilities except the surface of the electrodes. In the spectroscopy with the multi-layr membrane, both spectral lines and one-dimensional, special distribution was observed. As our spectroscopic pictures were obtained by integrating 50-100 times shots, the profile of special distribution was quite ambiguous. However, both spectral lines and special profile will be obtained simultaneously for more bright X-ray source.