Differential cross section measurements at 10 eV region for one-electron caputure processes concerning multiply-charged ion collisions.

10 eV 区域的微分截面测量，用于涉及多电荷离子碰撞的单电子捕获过程。

• 批准号: 08454115
• 负责人: ITOH Yoh
• 金额: $ 4.67万
• 依托单位: Faculty of Science, Josai University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 1996
• 资助国家: 日本
• 起止时间: 1996 至 1998
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-08454115/
• 关键词: Multi-charged ion; One-electron caputure; Differential cross section; Low energy collision; 低エネルギー; 断面積; エネルギー分析; 衝突径数; ノズルビーム; FIFO

The performance of the crossed-beam apparatus to measure the angular distribution of the scattered ions created by charge-transfer reactions was improved much. It consists of a small Electron-Beam-Ion-Source, a double electrostatic hemispherical energy-selector, and an ion detector. To obtain good energy- and angular-resolution, a supersonic nozzle-beam is used to prepare the target. The accuracy of the collision-energy detennination was found to be better than 0.1 eV, and that of angular -reading was about 0.5 degree. The ions were extracted from the source by the extraction potential of 2 kV, then decelerated to 250 x q eV, where q denote the charge-state of the ions, then mass-selected by a Wien-filter. The mass-selected ions were decelerated to the transmission energy of the selector, about 30 xq eV, then again decelerated to the desired collision energy using two sets of three-element lens.The angular divergence of the primary beam was about*0.5 degree , and the energy spread was estimated to be 0.3 x q eV, at FWHM.The intensity of the beam was in the order of pA at 10 eV.For the energy analysis of the product ions, a 90 degree electrostatic cylindrical deflector was used, and a position-sensitive detector system is attached to that. During the course of this study, it is noticed that the most important point is the noise redaction. Therefore, the analyzer system is located inside well shielded-box.The kinetic energy of 0^<2+> ions produced in one-electron capture process in 0^<2+> + He collisions were measured at Ecm = 10 eV, from 0 to 5 degree in the laboratory frame. Only a single peak was observed on the energy spectrum. This peak corresponds to the reaction, 0^<2+>(^3P) + He ---> 0^+(^2P) + H^e + 5.6 eV ; this agrees well with that reported previously, and proved that the performance of the apparatus is good enough to do measurement in an unexplored energy region.

改进了交叉束装置测量电荷转移反应散射离子角分布的性能。它由小型电子束离子源、双静电半球形选能器和离子探测器组成。为了获得良好的能量和角度分辨率，使用超声速偏转束来制备靶。碰撞能量测定的精度优于0.1eV，角度阅读的精度约为0.5度。通过2kV的提取电势从源提取离子，然后减速至250 x q eV，其中q表示离子的电荷状态，然后通过Wien过滤器进行质量选择。质量选择的离子被减速到选择器的透射能量，约30 × q eV，然后使用两组三元件透镜再次减速到所需的碰撞能量。初级束的角发散度约为0.5度，能量扩展估计为0.3 × q eV，对于产物离子的能量分析，使用90度静电圆柱形偏转器，并将位置敏感检测器系统连接到其上。在本研究的过程中，我们注意到最重要的一点是噪声抑制。在实验室坐标系下，测量了0^<2+> + He碰撞中单电子俘获过程中产生的0^<2 +>离子的动能（Ecm = 10 eV，0 ~ 5 °）。在能谱上只观察到一个峰。该峰对应于反应0^<2+>（^3P）+ He ---> 0^+（^2P）+ H^e + 5.6 eV，这与以前报道的结果一致，证明了该装置的性能足以在未探测的能区进行测量。

项目成果

Yoh Itoh: "State-Selective Differential cross Section Measurements on O^<2T>-He System at Ecm=10eV." 発表予定.

Yoh Itoh：“Ecm=10eV 时 O^<2T>-He 系统的状态选择性微分截面测量”。

Y.Itoh: "The measured angular distribution of O^+ions produced in : O^<2+> +He collisions at E_<cm>=10eV." (to be published).

Y.Itoh：“在 E_<cm>=10eV 处的 O^<2> He 碰撞中产生的 O^ 离子的测量角分布。”

Y.Itoh: "STATE-SELECTIVE DIFFERENTIAL CROSS SECTION MEASUREMENTS FOR ONE-ELECTRON CAPTURE PROCESSES AT 10eV REGION." Abstract of contributed paper : XXI ICPEAC. (in press). (1999)

Y.Itoh：“10eV 区域单电子捕获过程的状态选择性差分截面测量。”

Y.Itoh: "State-Selective Differential Cross Section Measuremants For One-Electron Capture Processes AT 10eV Region" Abstract of Contributed Paper : XXI ICPEAC. in press. (1999)

Y.Itoh：“10eV 区域单电子捕获过程的状态选择性差分截面测量”贡献论文摘要：XXI ICPEAC。