Structural Study of Reversible Phase Change Recording Materials by Anomalous Garzing Incidence X-ray Scattering

反常Garzing入射X射线散射研究可逆相变记录材料的结构

• 批准号: 12650654
• 负责人: SAITO Masatoshi
• 金额: $ 2.3万
• 依托单位: Niigata University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2000
• 资助国家: 日本
• 起止时间: 2000 至 2001
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-12650654/
• 关键词: Phase Change Recording Material; Anomalous X-ray Scattering; Amorphous; Total Reflection

The purpose of this research is to analyze precisely the reversible structural change in phase change recording materials represented for CD-RW by the anomalous X-ray scattering (AXS) method under the grazing incidence condition. The phase change recording materials, using the variation of optical reflectivity between crystalline and non-crystalline phases, attract much attention as a storaging medium of digital information. These materials have already been commercialized and their upgrading such as capacity enlargement and high reliability will advance in future more and more. As showing this tendency to increase, it is anticipated that the structural control greatly influences their characteristics. Therefore, the structural analysis of phase change recording materials in the atomic level might be one of important subjects for developing steadily these fields. The AXS method by using the anomalous dispersion effect may be one of powerful tools for obtaining the structural informatio … More n in the atomic level.In 2000, the local structural information of amorphous Ag-Br-Ge-O system has been estimated from the AXS measurements using Ge and Br K absorption edges. The resultant structural parameters suggest mat GeO_4 tetrahedral unit is the probable structural entity in this glass and the arrangement of Ag and Br ions is similar to that in crystalline AgBr. From these results, effectiveness of the AXS method for characterizing amorphous materials could be confirmed.In 2001, the usefulness and validity of energy dispersive grazing incidence X-ray reflectometry have been demonstrated for characterizing the multilayer interfaces. The method appears to hold promise in reducing difficulty of conventional angular dispersive method due to absorption with an upper layer by enabling the use of high energy white X-ray radiation and obtaining much higher reflected intensity. Taken from all results in this research, it would be very interesting to extend the present method to other systems. Less

本研究的目的是利用异常x射线散射（AXS）方法精确分析以CD-RW为代表的相变记录材料在掠入射条件下的可逆结构变化。相变记录材料利用晶体与非晶体之间的光反射率变化作为数字信息的存储介质，受到了广泛的关注。这些材料已经实现了商业化，未来将越来越多地向容量扩大和高可靠性等方面进行升级。由于这种增长趋势，可以预见，结构控制对它们的特性有很大的影响。因此，在原子水平上对相变记录材料进行结构分析可能是稳定发展这一领域的重要课题之一。利用异常色散效应的AXS方法可能是在原子水平上获得结构信息的有力工具之一。在2000年，利用Ge和brk吸收边从AXS测量中估计了非晶Ag-Br-Ge-O体系的局部结构信息。所得的结构参数表明，该玻璃的结构实体可能是四面体单元，Ag和Br离子的排列与结晶AgBr相似。这些结果证实了AXS法表征非晶材料的有效性。2001年，证明了能量色散掠入射x射线反射法在多层界面表征中的实用性和有效性。该方法有望通过使用高能白光x射线辐射并获得更高的反射强度，从而减少由于上层吸收而导致的传统角色散方法的困难。从本研究的所有结果来看，将目前的方法扩展到其他系统将是非常有趣的。少

项目成果

S.Kang: "Anomalous X-ray scattering study of local structures in the superionic conducting glass (AgBr)_<0.4>(A_<g2>O)_<0.3>(Ge<O_2>)_<0.3>"Science and Technology of Advanced Materials. 1. 37-42 (2000)

S.Kang：“超离子导电玻璃(AgBr)_<0.4>(A_<g2>O)_<0.3>(Ge<O_2>)_<0.3>局部结构的异常X射线散射研究”科学与

S. Sato, T. Imanaga, E. Matsubara, M. Saito and Y. Waseda: "Application of Energy Dispersive Grazing Incidence X-ray Reflectometry Method to Structural Analysis of Liquid/Liquid and Liquid/Solid Interfaces"Mater. Trans. JIM. Vol. 41. 1651-1656 (2000)

S. Sato、T. Imanaga、E. Matsubara、M. Saito 和 Y. Waseda：“能量色散掠入射 X 射线反射测量方法在液/液和液/固界面结构分析中的应用”材料。

S.Sato: "Application of Energy Dispersive Grazing Incidence X-ray Reflectometry Method to Structural Analysis of Liquid/Liquid and Liquid/Solid Interfaces"Materials Transactions, JIM. 41(12). 1651-1656 (2000)

S.Sato：“能量色散掠入射 X 射线反射测量方法在液/液和液/固界面结构分析中的应用”Materials Transactions，JIM。

S. Kang, M. Saito, K.T. Jacob and Y. Waseda: "Anomalous X-ray scattering study of local structures in the superionic conducting glass (AgBr)_<0.4>(Ag_2O)_<0.3>(GeO_2)_<0.3>"Sci. Tech. Adv. Mater.. Vol. 1. 37-42 (2000)

S. Kang, M. Saito, K.T.

S.Kang: "Anomalous X-ray scattering study of local structures in the superionic conducting glass (AgBr)_<0.4>(Ag_2O)_<0.3>(GeO_2)_<0.3>"Science and Technology of Advanced Materials. 1. 37-42 (2000)

S.Kang：“超离子导电玻璃(AgBr)_<0.4>(Ag_2O)_<0.3>(GeO_2)_<0.3>局部结构的异常X射线散射研究”先进材料科学与技术。