Structural Study of Reversible Phase Change Recording Materials by Anomalous Garzing Incidence X-ray Scattering

本研究的目的是用反常X射线散射(AXS)方法精确分析掠入射条件下CD-RW记录材料的可逆结构变化。相变记录材料利用晶相和非晶相之间光学反射率的变化，作为数字信息的存储介质，引起了人们的广泛关注。这些材料已经商业化，未来将越来越多地进行扩容、高可靠性等升级。由于这一趋势呈增加趋势，预计结构控制对其特性有很大影响。因此，相变记录材料在原子水平上的结构分析可能是这一领域稳步发展的重要课题之一。利用反常色散效应的AXS方法可能是获取…结构信息的有力工具之一2000年，利用Ge和BrK吸收边的AXS测量，估算了非晶态Ag-BrGe-O系统的局域结构信息。由此得到的结构参数表明，MAT GeO_4四面体单元可能是该玻璃中的结构实体，而Ag和Br2+的排列方式类似于晶体AgBr.2001年，能量色散掠入射X射线反射仪用于表征多层膜界面的有效性和有效性得到了验证。通过利用高能白X射线辐射并获得更高的反射强度，该方法似乎有望降低传统角色散方法由于上层吸收而造成的困难。从本研究的所有结果来看，将本方法推广到其他系统将是非常有趣的。较少

The purpose of this research is to analyze precisely the reversible structural change in phase change recording materials represented for CD-RW by the anomalous X-ray scattering (AXS) method under the grazing incidence condition. The phase change recording materials, using the variation of optical reflectivity between crystalline and non-crystalline phases, attract much attention as a storaging medium of digital information. These materials have already been commercialized and their upgrading such as capacity enlargement and high reliability will advance in future more and more. As showing this tendency to increase, it is anticipated that the structural control greatly influences their characteristics. Therefore, the structural analysis of phase change recording materials in the atomic level might be one of important subjects for developing steadily these fields. The AXS method by using the anomalous dispersion effect may be one of powerful tools for obtaining the structural informatio … More n in the atomic level.In 2000, the local structural information of amorphous Ag-Br-Ge-O system has been estimated from the AXS measurements using Ge and Br K absorption edges. The resultant structural parameters suggest mat GeO_4 tetrahedral unit is the probable structural entity in this glass and the arrangement of Ag and Br ions is similar to that in crystalline AgBr. From these results, effectiveness of the AXS method for characterizing amorphous materials could be confirmed.In 2001, the usefulness and validity of energy dispersive grazing incidence X-ray reflectometry have been demonstrated for characterizing the multilayer interfaces. The method appears to hold promise in reducing difficulty of conventional angular dispersive method due to absorption with an upper layer by enabling the use of high energy white X-ray radiation and obtaining much higher reflected intensity. Taken from all results in this research, it would be very interesting to extend the present method to other systems. Less