Research on Evaluating Noise Location with High Resolution by Field-Scanning on Closed Surface

封闭曲面场扫描高分辨率噪声定位研究

• 批准号: 14550408
• 负责人: SAWAYA Kunio
• 金额: $ 2.24万
• 依托单位: Tohoku University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2002
• 资助国家: 日本
• 起止时间: 2002 至 2003
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-14550408/
• 关键词: Electromagnetic wave; Estimation of EM Source; EMC; Antenna; Modulated scattering element; Noise; 変調散乱素子; 不要放射; 電波ホログラフィ; 平面走査; 球面走査; 分解能; 環境電磁工学; モーメント法

In this research, methods to estimate the location of the source with high resolution have been established to find the undesired radiation sources in the electrical and electronic devices which affect the performance of the other devices and cause the serious interference problem.First, a method to determine the coefficient of power series of the spherical expansion modes has been investigated to obtain a high resolution especially at low frequency. The effect of the mutual coupling between the array elements on the resolution has also been studied to obtain the information on source location with high resolution by using the MUSIC algorithm.Next, the sources of undesired radiation from a printed circuit board have been estimated by using the improved planar scanning technique.Then, a method of measuring the radiation pattern of the electromagnetic source has been proposed by using the modulated scattering elements. The measurement system has been established which can be used to measure the amplitude of the electromagnetic wave in several points simultaneously.Moreover, the near field measurement without disturbing the current distribution on the electromagnetic source has been developed. The amplitude of the undesired electromagnetic wave from the noise sources can be accurately measured by using this method. The experiment has been performed to show the effectiveness of the method.

本研究建立了高分辨率估计源位置的方法，以发现电气和电子设备中影响其他设备性能并造成严重干扰问题的不需要的辐射源。首先，研究了一种确定球面展开模式的幂级数系数的方法，以获得高分辨率，特别是在低频下。还研究了阵列单元之间的互耦合对分辨率的影响，以便利用MUSIC算法获得高分辨率的源位置信息。接下来，利用改进的平面扫描技术估计了印刷电路板的不良辐射源。然后，提出了一种利用调制散射单元测量电磁源辐射方向图的方法。建立了可同时测量多点电磁波幅值的测量系统，并开发了不干扰电磁源电流分布的近场测量方法。利用该方法可以准确测量来自噪声源的干扰电磁波的幅度。实验验证了该方法的有效性。

项目成果

平 和昌, 加藤 崇, 澤谷 邦男: "MUSICアルゴリズムを用いた電子レンジからの漏洩波の波源位置推定"電子情報通信学会技術研究報告. EMCJ2003-87. 55-60 (2003)

Kazumasa Taira、Takashi Kato、Kunio Sawaya：“使用 MUSIC 算法估计微波炉泄漏波的源位置”EMCJ2003-87 (2003)。

Yuzo Yoshimoto, Kazumasa Taira, Kunio Sawaya: "Estimation of multiple coherent source locations using signal subspace fitting technique combined with SPM method"Technical Report of IEICE, EMCJ2003-85. 43-48 (2003)

Yuzo Yoshimoto、Kazumasa Taira、Kunio Sawaya：“利用信号子空间拟合技术结合SPM方法估计多个相干源位置”IEICE技术报告，EMCJ2003-85。

義本祐三, 平和昌, 澤谷邦男: "SPM法と信号部分空間法との組み合わせによる複数コヒーレント波源の位置推定"電子情報通信学会技術研究報告. EMCJ2003-85. 43-48 (2003)

Yuzo Yoshimoto、Heiwamasa、Kunio Sawaya：“结合 SPM 方法和信号子空间方法的多个相干波源的位置估计” IEICE 技术报告 43-48 (2003)。

Teruo Tobana, Qiang Chen, Kunio Sawaya, Takayuki Sasamori, Kohshi Abe: "Numerical Analysis of Suppression Effect of Emission from Printed Circuit Board by Using Ferrite Plates"Trans.IEICE, Japan. vol.K85-B, no.2. 250-257 (2002)

Teruo Tobana、Qiang Chen、Kunio Sawaya、Takayuki Sasamori、Kohshi Abe：“使用铁氧体板抑制印刷电路板发射效果的数值分析”Trans.IEICE，日本。

Kan Okubo, Qiang Chen, Kunio sawaya, Takayasu Shiokawa: "Consideration on an Emission from Microstrip Line with a 90 Degree Bend"Trans.IEICE, Japan. Vol.J86-B, No.8. 1659-1662 (2003)

Kan Okubo、Qiang Chen、Kunio sawaya、Takayasu Shiokawa：“考虑 90 度弯曲微带线的发射”Trans.IEICE，日本。