Evaluation of Damage in DNA Molecules caused by Very-Low-Frequency Magnetic Fields Using Bacterial Cells
Evaluation of Damage in DNA Molecules caused by Very-Low-Frequency Magnetic Fields Using Bacterial Cells
批准号:
15360153
负责人:
HAGA Akira
金额:
$7.42万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2005
中文摘要
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英文摘要
The effect of intermediate frequency magnetic fields or, very-low-frequency magnetic fields (VLFMIF) on living biological cells was investigated using a highly sensitive mutagenesis assay method. A bacterial gene expression system for mutation repair (umu system) was used for the sensitive evaluation of damage in DNA molecules. According to Miyakoshi's investigation, mutant frequency of HPRT gene was proportional to the induced current.In our study, Salmonella typhimurium TA1535 /pHYUmuLuxAB were exposed to VLFMF (20 kHz and 1mT) in a specially designed magnetic field loading chamber.20 kHz and 1mT was almost same as 50 Hz and 400 mT in terms of f×B. However, no significant differences between exposure to 20 kHz and 1 mT magnetic fields and control were observed in the umu gene expression. This may be attributed to the radius of Schale for culture. The induced current density in culture is shown following equation.J=_<σΠ> fBrWhere σ : conductivity of culturef : magnetic field frequencyB : magnetic flux densitiesr : radius of ShaleThe induced current is proportional to not only f×B but also r of Schale for culture. The radius r of Schale used by experiment of Miyakoshi was approximately 10 times larger than that of microtube using in our study. Then current induced by 50 Hz and 400 mT magnetic field was 10 times larger than that of our experiment.
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芳賀 昭, 熊谷嘉晃, 遠藤銀朗, 松木英敏: "発光遺伝子を組み込んだ細菌細胞を用いたVLF磁界曝露によるDNA損傷の評価"電気学会マグネティクス研究会. MAG-03-90. 15-19 (2003)
Akira Haga、Yoshiaki Kumagai、Ginro Endo、Hidetoshi Matsuki:“使用包含发光基因的细菌细胞评估暴露于 VLF 磁场引起的 DNA 损伤”IEEJ MAG-03-90 (2003)。
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Evaluation of Damage in DNA Molecules by Very Low Frequency magnetic Field Using Bacterial Cells with Bioluminescence Gene
利用带有生物发光基因的细菌细胞评估极低频磁场对 DNA 分子的损伤
DOI:
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发表时间:
2004
期刊:
Proceedings of International Symposium on Electromagnetic Compatibility, EMC Sendai 2004 Vol.1
影响因子:
--
作者:
[Akira Haga, Yoshiaki Kumagai, Hidetoshi Mathuki, Ginro Endo]
通讯作者:
Ginro Endo
芳賀昭, 鎌田清孝校, 沖津隆志, 村松和弘: "環境電磁界の評価-電磁調理器から生ずる漏洩磁界の測定と磁場解析-"Proceeding of Conference on Electromagnetic Phenomena and dynamics. 207-212 (2004)
Akira Haga、Kiyotaka Kamata、Takashi Okitsu、Kazuhiro Muramatsu:“环境电磁场的评估 - 电磁炊具产生的泄漏磁场的测量和磁场分析”电磁现象和动力学会议记录 207-212 (2004)。
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发表时间:
2004
期刊:
Proceedings of International Symmposium on Electromagnetic Compatibility, EMC Europe 2004 Vol.1
影响因子:
--
作者:
[Kiyotaka Kamato, Akira Haga]
通讯作者:
Akira Haga
umuシステムを用いた20kHz磁界曝露による細菌細胞のDNA損傷評価
使用umu系统评估20kHz磁场暴露引起的细菌细胞DNA损伤
DOI:
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发表时间:
2004
期刊:
電気学会マグネティクス研究会資料 MAG-04-144
影响因子:
--
作者:
[芳賀 昭, 熊谷嘉晃, 遠藤銀朗, 五十嵐 啓, 小林 宏一郎, 松木英敏]
通讯作者:
松木英敏
共 12 条
Development of non-destructive test of measuring the concrete crack depth
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批准号:12555079
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$2.24万
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财政年份:2000
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负责人:HAGA Akira
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依托单位:
Use of a Bacterial Gene Expression System for Mutation Repairing (umu system) to evaluate Damage in DNA Molecules Resulting from Exposure to an Extra Low Frequency Magnetic Field
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批准号:10837015
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.05万
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财政年份:1998
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负责人:HAGA Akira
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依托单位:
Measurements of ELF and VLF Emissions from VDTs.
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批准号:06650477
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项目类别:Grant-in-Aid for General Scientific Research (C)
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资助金额:$1.15万
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财政年份:1994
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负责人:HAGA Akira
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依托单位: