Study on precise potential measurements by nano-probes and on investigation of electronic properties in nanostructures

点击翻译按钮获取中文摘要

We have added our original improvements on Kelvin probe microscopy (KFM) which is one kind of nano-probe technieques in order to ensure high accuracy, high spatial resolution, and high reliability in potential measurements. By means of this method, potential distribution around self-assembled InAs quantum dots was investigated and some electronic properties like a charging effect in the quantum dots were discussed. In addition, we observed photovoltaic properties on multicrystalline Si solar cell materials by KFM operated under light illumination and found the degradation of minority carrier dynamics around the grain boundary.