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Electrostatic potential analysis of ferroelectric domains using convergent-beam electron diffraction

Electrostatic potential analysis of ferroelectric domains using convergent-beam electron diffraction
使用会聚束电子衍射对铁电域进行静​​电势分析
批准号:
20340070
负责人:
TSUDA Kenji
金额:
$11.9万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2008
资助国家:
日本
项目状态:
已结题
起止时间:
2008 至 2010

项目摘要

项目成果

TSUDA Kenji的其他基金

相关文献

中文摘要
翻译
利用会聚束电子衍射的静电势分析方法已被成功地开发,这使我们能够确定从纳米尺度的样品区域的静电势分布。利用这种方法,通过静电势观察了LiNbO3等铁电材料的铁电极化。该方法也被应用于强关联电子系统中3d电子轨道有序态的可视化。
英文摘要
An electrostatic potential analysis method using convergent-beam electron diffraction has been successfully developed, which enables us to determine electrostatic potential distribution from a nanometer-scale specimen area. Using this method, ferroelectric polarizations of ferroelectric materials such as LiNbO3 were observed through electrostatic potential. The method was also applied to visualization of orbital ordered states of 3d electrons in strongly-correlated electron systems.
期刊论文(0)
专著(0)
科研奖励(0)
会议论文
DOI: --
发表时间: 2009
期刊: J. Ceram. Soc. Jpn.
影响因子: --
作者: [Kyota Uheda, Hajime Yamamoto, Hisanori Yamane, Wataru Inami, Kenji Tsuda, Yoshinobu Yamamoto and Naoto Hirosaki]
通讯作者: Yoshinobu Yamamoto and Naoto Hirosaki
電子線による局所構造解析
使用电子束进行局部结构分析
DOI: --
发表时间: 2010
期刊:
影响因子: --
作者: [M.Okawa, Y.Yakata, ほか13名, Ryo Fukaya, 津田健治]
通讯作者: 津田健治
DOI: --
发表时间: 2009
期刊: Solid State Communications 149
影响因子: --
作者: [JI. Yamaura, Z. Hiroi, K. Tsuda, K. Izawa, Y. Ohishi, S. Tsutsui]
通讯作者: S. Tsutsui
DOI: 10.1021/cm103389q
发表时间: 2011-03
期刊: Chemistry of Materials
影响因子: 8.6
作者: [M. Yashima;S. Matsuyama;R. Sano;M. Itoh;K. Tsuda;D. Fu]
通讯作者: M. Yashima;S. Matsuyama;R. Sano;M. Itoh;K. Tsuda;D. Fu
共 43 条
    Structure analysis of ferroelectric domain walls using coherent convergent-beam electron diffraction
    • 批准号:
      25630272
    • 项目类别:
      Grant-in-Aid for Challenging Exploratory Research
    • 资助金额:
      $2.58万
    • 财政年份:
      2013
    • 负责人:
      TSUDA Kenji
    • 依托单位:
    Development of a nanoscale point-defect analysis method using convergent-beam electron diffraction and its application to point-defect-induced properties
    • 批准号:
      17510083
    • 项目类别:
      Grant-in-Aid for Scientific Research (C)
    • 资助金额:
      $2.3万
    • 财政年份:
      2005
    • 负责人:
      TSUDA Kenji
    • 依托单位: