Energy analyzer and compact analysis chamber for high-resolution photoelectron spectroscopy

申请人的研究小组从事半导体衬底上外延生长的超薄吸附薄膜的合成和研究，从亚单层覆盖率到薄膜厚度在几个10纳米的范围内。科学兴趣尤其集中在具有拓扑性质和电子关联的2D原子单层的不同寻常的电子性质上。主要的实验方法是角分辨光电子能谱(ARPES)和扫描隧道显微镜/光谱分析(STM/STS)。由于其固有的表面特性，所有上述薄膜系统都必须在现场(即完全在超高真空条件下)制备和研究。然而，目前可用的ARPES设备在动量和能量分辨率以及样品吞吐量方面正在达到其极限。为此，将采购一台专门的、最先进的动量成像光电子分析仪，以满足我们新的高分辨率VUV光源的能力。与分析真空室-样品机械手系统相结合，该系统明显比目前的系统更紧凑，克服了以前的限制，打开了极大改善的研究机会。

The applicant's research group deals with the synthesis and investigation of ultra-thin, epitaxi-ally grown adsorbate films on semiconductor substrates, from sub-monolayer coverages to film thicknesses in the range of a few 10 nm. The scientific interest is focused in particular on the unusual electronic properties of 2D atomic monolayers with topological properties and electronic correlations. The main experimental methods used are angle-resolved photo-electron spectroscopy (ARPES) and scanning tunneling microscopy and spectroscopy (STM/STS). Due to their intrinsic surface character, all mentioned film systems have to be fabricated and investigated in situ (i.e., completely under ultra-high vacuum conditions). How-ever, the currently available ARPES facility is reaching its limits in terms of momentum and energy resolution as well as its sample throughput. For this reason, a dedicated, state-of-the-art momentum-imaging photoelectron analyzer tailored to the capabilities of our new high-resolution VUV source is to be procured. Together with an analysis vacuum chamber-sample manipulator system that is significantly more compact than the current system, the previous limitations are overcome and greatly improved research opportunities are opened up.