Control of nonlinear cantilever oscillation in dynamic-mode atomic force microscopy

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Dynamic-mode atomic force microscopy has been a fundamental tool for research and development in the fields of nanoscience and nanotechnology. This microscopy enables us to observe topography and physical properties of sample surfaces by utilizing cantilever sensors that are extremely sensitive for tiny force at the atomic and molecular level. On the other hand, it has been recently reported that significant performance degradation can occur during measurement due to the irregular oscillation of cantilever sensors. In this research project, we proposed a novel control method for overcoming the performance degradation and newly developed a prototype controller for cantilever oscillation. The control performance was successfully demonstrated in an actual dynamic-mode atomic force microscope.