Self-exciting magnetic force microscopy with 1-10 nm resolution and spin structure observation

点击翻译按钮获取中文摘要

Magnetic force microscopy with sensitivity less than 10 nm was studied from the view point of operating system and magnetic tip. The recorded pattern with 18 nm bit length and magnetic dot with 15 nm in diameter were observed and the spatial resolution of 8 nm was achieved. Magnetic domain structures of ferromagnetic CoPt and FePt dots, and antiferromagnetic coupled [CoPd]/Ru/[CoPd] dots were observed. It was revealed that the magnetization reversal of all dot patterns proceeds through the reversal of activation volume and successive movement of domain. Specific asymmetric magnetization reversal was firstly observed in the antiferromagnetic coupled [CoPd]/Ru/[CoPd] dot.