The mechanism of chilling injury induced by high root temperature in rice seedlings

高根温对水稻幼苗叶片造成严重的冷害。第一个可检测到的事件是叶片中硝酸盐和亚硝酸盐的积累，其次是光系统II中QA和QB之间的电子传递被阻断。这伴随着thylakoidΔpH的损失，热耗散的故障，光系统II的过度减少。因此，随后产生的活性氧和/或过氧化脂质会破坏膜，如类囊体、叶绿体包膜和细胞质，导致叶片死亡。

High root temperature induces severe chilling injury in the leaves of rice seedlings. The first detectable event was the accumulation of nitrate and nitrite in the leaves, followed by the electron transport to be blocked between QA and QB in photosystem II. This was accompanied by the loss of thylakoidΔpH, malfunction of thermal dissipation, and over-reduction of photosystem II. Thus, the consequent generation of ROS and/or lipid peroxide should destroy the membranes such as thylakoid, chloroplast envelope, and cytoplasm, to lead to the leaf death.