Response studies on polymeric etched track detectors using some chemical damage parameters

几种PET、PC、PI和PADC薄膜的蚀刻轨迹探测器在空气中暴露于质子和重离子He、C、Ne、Si、Ar、Fe、Kr和xe离子中。检测的停止功率范围在10 ~ 12000 keV/μm之间。化学损伤参数的损伤密度（即每单位轨道长度的考虑官能团损失的数量）、考虑官能团损失的轨道核径向尺寸以及每组的辐射化学产率G值作为停止功率的函数进行评估。当径向迹芯尺寸大于聚合物链两个相邻断裂点之间的距离时，潜迹将被蚀刻。这种主要的断裂点是醚、酯和碳酸盐酯键中的C-O键。

Several etched track detectors of PET, PC, PI and PADC films are exposed to proton and heavy ions, He, C, Ne, Si, Ar, Fe, Kr andXe ions, in the air. The examined region of stopping power was between 10 and 12,000 keV/μm. Chemical damage parameters of damage density, which is the number of loss of considering functional groups per unit length of tracks, radial size of track core, in which the considering chemical groups are lost, and the radiation chemical yields, G values, for each group are evaluated as a function of the stopping power. Latent track will be etchable when the radial track core size is larger than the distance between two adjacent breaking points of polymer chains. Such dominant breaking points are C-O bonds in ether, ester and carbonate ester bonds.