Development of Stress Relaxation probe microscopy for Nanorheology Mapping

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Based on atomic force microscopy (AFM), I have developed “AFM load relaxation measurement technique," in which an AFM probe is pushed on a sample surface and then kept the position so that the relaxing load is measured. I fulfilled quantitative measurement of therelaxation behavior of elastic materials caused by viscoelasticity and adhesion of the surface. I also extended the system to mapping measurement so that the distribution of viscoelasticity can be visualized on nanoscale lateral resolution. The mapping system showed the capability of application to evaluate the nanomechanical properties of elastomer composite materials.