Nanometer-resolved in situ observation of surface plasmons based on enhanced electron emission

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We have tackled the development of a novel microscopy to visualize surface plasmon intensity on a metal surface with nanometeric resolution on the basis of the secondary electron emission enhancement effect. An optical system, in which surface plasmon is excited on a metal thin film deposited on a prism by laser light supplied from outside, was constructed in the specimen chamber of a scanning electron microscope (SEM). Intensity change in the SEM image corresponding to the laser power was observed.