Nanoscale inhomogeneity of Earth's constituent materials studied by in-situ small angle X-ray scattering under high pressure

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We have developed techniques for in-situ small-angle X-ray scattering measurement under high pressure. It is now possible to collect data for small samples in a diamond-anvil cell at a Q-range approximately from 0.1 to 2.0 nm-1. Three types of noncrystalline SiO2 have been measured so far with the new techniques and the following interesting results have been obtained; (1) the density difference between grains and grain boundaries did not completely diminish even at the highest pressure in experiments for silica glass and fumed silica up to 50 GPa and (2) the size of pores enlarged with increasing pressure in experiments for mesoporous silica up to 20 GPa.