Feasibility Study of Novel Microscopic Spectroscopy Method Based on Light Absorption Using Atomic Force Microscopy

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Irradiation of light with the wavelength specific to a particular material induces dipole transition. By detecting this transition with a high spatial resolution a novel microscopic spectroscopic analysis method will be implemented. Here in order to detect this weak electric field with high sensitivity the surface plasmon induced at the apex of metallic probe of atomic force microscopy (AFM) is utilized. Sensitivity enhancement of an AFM scheme including use a quartz tuning fork as a force sensor is attempted in order to implement a high-sensitivity and non-optical force detection. A novel quartz sensor holder integrated with a differential-type charge amplifier was developed.