multi-analysis of bone-implant interface using X-ray analysis and electron tomography

点击翻译按钮获取中文摘要

Bone and Titanium are mineralized tissue and hard material. It is difficult to prepare thin specimens or surface fabrication of these tissues for transmission and scanning electron microscope observation without demineralizing them. We present a novel method of creating a cutting surface including the bone and titanium interface using the focus Ion beam (FIB) method and Scaninig Ion Microscope (SIM). This method is appropriate for nano-fabrication of thin specimens for brittle and hard materials such as bone and titaniumu. The major advantage of this method is its ability to visualize ultra-structurure in interface of highly calcified specimens without demineralization.